Department of Prosthodontics and Periodontology, University of São Paulo - Bauru School of Dentistry, Bauru, SP, Brazil.
Biomaterials Division, New York University College of Dentistry, New York, New York, USA.
J Esthet Restor Dent. 2024 Jan;36(1):47-55. doi: 10.1111/jerd.13140. Epub 2023 Sep 29.
To evaluate the effect of different hydrofluoric acid concentrations and etching times on the surface, chemical composition and microstructure of lithium disilicate.
Ninety specimens of pressed lithium disilicate (LDS) were obtained (IPS e.max Press, Rosetta SP and LiSi Press). The specimens of each material were divided in two groups according to the hydrofluoric acid concentration: 5% and 10% (n = 15/group), and subdivided according to the etching time: 20, 40 and 60 s (n = 5/group). Crystalline evaluations and chemical composition were performed through x-ray diffraction (XRD) and energy-dispersive x-ray spectroscopy (EDS), respectively. Microstructural analyses were performed by scanning electron microscope (SEM), surface roughness (Ra), and material thickness removal evaluation. Thickness removal and Ra data were analyzed by ANOVA and Tukey test (p < 0.05).
XRD demonstrated characteristic peaks of lithium disilicate crystals, lithium phosphate and of a vitreous phase for all materials. EDS identified different compositions and SEM confirmed different surface responses to acid etching protocols. Material and etching time influenced Ra and material thickness removal (p < 0.05).
Hydrofluoric acid concentration and etching time affect the surface characteristics of LDS differently. LiSi Press presented higher resistance to hydrofluoric acid etching compared to e.max Press and Rosetta SP.
Applying the appropriate etching protocol is pivotal to avoid excessive material removal and to prevent jeopardize the mechanical and optical properties of the material.
评估不同浓度氢氟酸和蚀刻时间对锂硅玻璃陶瓷表面、化学成分和微观结构的影响。
获得了 90 个压制的锂硅玻璃陶瓷(IPS e.max Press、Rosetta SP 和 LiSi Press)试件。根据氢氟酸浓度将每种材料的试件分为 5%和 10%(n=15/组)两组,并根据蚀刻时间进一步细分为 20、40 和 60 s(n=5/组)。通过 X 射线衍射(XRD)和能谱(EDS)分别进行结晶评估和化学成分分析。通过扫描电子显微镜(SEM)进行微观结构分析,测量表面粗糙度(Ra)和材料去除厚度。采用方差分析和 Tukey 检验(p<0.05)对厚度去除和 Ra 数据进行分析。
XRD 显示了所有材料的锂硅晶体、磷酸锂和玻璃相的特征峰。EDS 确定了不同的组成,SEM 则证实了不同的表面对酸蚀协议的不同反应。材料和蚀刻时间影响 Ra 和材料去除厚度(p<0.05)。
氢氟酸浓度和蚀刻时间对 LDS 的表面特性有不同的影响。与 e.max Press 和 Rosetta SP 相比,LiSi Press 对氢氟酸蚀刻具有更高的抵抗力。
应用适当的蚀刻协议对于避免过度的材料去除以及防止危及材料的机械和光学性能至关重要。