Zhang Heng, Wang Jianhang, Jin Luhong, Zhu Yunqi, Guo Yuting, Zhang Meng, Zhang Yuhui, Wang Zhixiong, Su Yisun, Wu Yicong, Ji Baohua, Toomre Derek, Liu Xu, Xu Yingke
bioRxiv. 2023 Jul 6:2023.07.05.547885. doi: 10.1101/2023.07.05.547885.
Structured illumination microscopy (SIM) is a versatile super-resolution technique known for its compatibility with a wide range of probes and fast implementation. While 3D SIM is capable of achieving a spatial resolution of ∼120 nm laterally and ∼300 nm axially, attempting to further enhance the resolution through methods such as nonlinear SIM or 4-beam SIM introduces complexities in optical configurations, increased phototoxicity, and reduced temporal resolution. Here, we have developed a novel method that combines SIM with augmented super-resolution radial fluctuations (aSRRF) utilizing a single image through image augmentation. By applying aSRRF reconstruction to SIM images, we can enhance the SIM resolution to ∼50 nm isotopically, without requiring any modifications to the optical system or sample acquisition process. Additionaly, we have incorporated the aSRRF approach into an ImageJ plugin and demonstrated its versatility across various fluorescence microscopy images, showcasing a remarkable two-fold resolution increase.
结构照明显微镜（SIM）是一种通用的超分辨率技术，以其与多种探针的兼容性和快速实现而闻名。虽然三维SIM能够在横向实现约120纳米、轴向实现约300纳米的空间分辨率，但试图通过非线性SIM或四光束SIM等方法进一步提高分辨率会带来光学配置的复杂性、增加光毒性并降低时间分辨率。在这里，我们开发了一种新方法，通过图像增强利用单幅图像将SIM与增强型超分辨率径向涨落（aSRRF）相结合。通过将aSRRF重建应用于SIM图像，我们可以将SIM分辨率各向同性地提高到约50纳米，而无需对光学系统或样品采集过程进行任何修改。此外，我们已将aSRRF方法集成到一个ImageJ插件中，并展示了其在各种荧光显微镜图像中的通用性，分辨率显著提高了两倍。
