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基于理查森-露西反卷积的超分辨率算法用于三维结构光照明显微术。

Super-resolution algorithm based on Richardson-Lucy deconvolution for three-dimensional structured illumination microscopy.

作者信息

Zhang Yanwei, Lang Song, Wang Hongwei, Liao Jiasheng, Gong Yan

出版信息

J Opt Soc Am A Opt Image Sci Vis. 2019 Feb 1;36(2):173-178. doi: 10.1364/JOSAA.36.000173.

DOI:10.1364/JOSAA.36.000173
PMID:30874094
Abstract

Three-dimensional structured illumination microscopy (3D-SIM) is a wide-field super-resolution technique in fluorescent imaging that can double the resolution beyond its classical limit. We introduce, to the best of our knowledge, a new 3D reconstruction algorithm based on the Richardson-Lucy deconvolution. The 3D-SIM imaging principle and the reconstruction steps are demonstrated in detail. Microspheres and biological specimen are used to present the performance of this method. The background of the out-of-focus portion is effectively suppressed, and true optical sectioning and super-resolution can be achieved simultaneously. For the custom-built 3D-SIM and this reconstruction algorithm, the measured resolution was 99.5±5   laterally and 294±9   axially.

摘要

三维结构光照明显微镜(3D-SIM)是荧光成像中的一种宽场超分辨率技术,其分辨率可超越经典极限,实现两倍提升。据我们所知,我们引入了一种基于理查森-鲁西反卷积的新三维重建算法。详细阐述了3D-SIM成像原理及重建步骤。使用微球和生物样本展示了该方法的性能。有效抑制了离焦部分的背景,可同时实现真正的光学切片和超分辨率。对于定制的3D-SIM和此重建算法,横向测量分辨率为99.5±5 ,轴向为294±9 。

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