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利用SbTe/BiTe拓扑绝缘体异质结构中费米能级的近狄拉克点移动实现自旋-电荷转换

Exploiting the Close-to-Dirac Point Shift of the Fermi Level in the SbTe/BiTe Topological Insulator Heterostructure for Spin-Charge Conversion.

作者信息

Longo Emanuele, Locatelli Lorenzo, Tsipas Polychronis, Lintzeris Akylas, Dimoulas Athanasios, Fanciulli Marco, Longo Massimo, Mantovan Roberto

机构信息

CNR-IMM, Unit of Agrate Brianza, Via C. Olivetti 2, Agrate Brianza 20864, Italy.

National Centre for Scientific Research "Demokritos", Institute of Nanoscience and Nanotechnology, Agia Paraskevi 15341, Athens, Greece.

出版信息

ACS Appl Mater Interfaces. 2023 Nov 1;15(43):50237-50245. doi: 10.1021/acsami.3c08830. Epub 2023 Oct 20.

Abstract

Properly tuning the Fermi level position in topological insulators is of vital importance to tailor their spin-polarized electronic transport and to improve the efficiency of any functional device based on them. Here, we report the full in situ metal organic chemical vapor deposition (MOCVD) and study of a highly crystalline BiTe/SbTe topological insulator heterostructure on top of large area (4″) Si(111) substrates. The bottom SbTe layer serves as an ideal seed layer for the growth of highly crystalline BiTe on top, also inducing a remarkable shift of the Fermi level to place it very close to the Dirac point, as visualized by angle-resolved photoemission spectroscopy. To exploit such ideal topologically protected surface states, we fabricate the simple spin-charge converter Si(111)/SbTe/BiTe/Au/Co/Au and probe the spin-charge conversion (SCC) by spin pumping ferromagnetic resonance. A large SCC is measured at room temperature and is interpreted within the inverse Edelstein effect, thus resulting in a conversion efficiency of λ ∼ 0.44 nm. Our results demonstrate the successful tuning of the surface Fermi level of BiTe when grown on top of SbTe with a full in situ MOCVD process, which is highly interesting in view of its future technology transfer.

摘要

在拓扑绝缘体中适当调节费米能级位置对于调整其自旋极化电子输运以及提高基于它们的任何功能器件的效率至关重要。在此,我们报告了在大面积(4英寸)Si(111)衬底上通过原位金属有机化学气相沉积(MOCVD)完整生长并研究高度结晶的BiTe/SbTe拓扑绝缘体异质结构。底部的SbTe层作为顶部生长高度结晶BiTe的理想籽晶层,还导致费米能级发生显著移动,使其非常接近狄拉克点,这通过角分辨光电子能谱得以可视化。为了利用这种理想的拓扑保护表面态,我们制备了简单的自旋电荷转换器Si(111)/SbTe/BiTe/Au/Co/Au,并通过自旋泵浦铁磁共振探测自旋电荷转换(SCC)。在室温下测量到了较大的SCC,并根据逆埃德尔斯坦效应进行了解释,从而得到转换效率λ ∼ 0.44 nm。我们的结果表明,通过完整的原位MOCVD工艺在SbTe顶部生长BiTe时,成功实现了BiTe表面费米能级的调节,鉴于其未来的技术转移,这非常令人感兴趣。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1549/10623560/62a25046273b/am3c08830_0001.jpg

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