Ohtake Akihiro, Suga Takayuki, Goto Shunji, Nakagawa Daisuke, Nakamura Jun
National Institute for Materials Science (NIMS), Tsukuba, 305-0044, Japan.
Department of Engineering Science, The University of Electro-Communications (UEC-Tokyo), Chofu, Tokyo, 182-8585, Japan.
Sci Rep. 2023 Oct 24;13(1):18140. doi: 10.1038/s41598-023-45142-y.
We present a combined experimental and theoretical study of the Se-treated GaAs(001)-([Formula: see text]) surface. The ([Formula: see text]) structure with the two-fold coordinated Se atom at the outermost layer and the three-fold coordinated Se atom at the third layer was found to be energetically stable and agrees well with the experimental data from scanning tunneling microscopy, low energy electron diffraction, and x-ray photoelectron spectroscopy. This atomic geometry accounts for the improved stability of the Se-treated surface against the oxidation. The present result allows us to address a long-standing question on the structure of the Se-passivated GaAs surface, and will leads us to a more complete understanding of the physical origin of the electrical and chemical passivation of Se-treated GaAs surface.