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分子铁电薄膜中负电容的首次观测。

First Observation of Negative Capacitance in Molecular Ferroelectric Thin Films.

作者信息

Feng Zi-Jie, Xiong Yu-An, Sun Wen-Cong, Sha Tai-Ting, Yao Jie, Pan Qiang, Hu Huihui, Dong Shuai, Xiong Ren-Gen, You Yu-Meng

机构信息

Jiangsu Key Laboratory for Science and Applications of Molecular Ferroelectrics, Southeast University, Nanjing, 211189, China.

Key Laboratory of Quantum Materials and Devices of Ministry of Education, School of Physics, Southeast University, Nanjing, 211189, China.

出版信息

Adv Mater. 2024 Mar;36(11):e2307518. doi: 10.1002/adma.202307518. Epub 2023 Dec 17.

DOI:10.1002/adma.202307518
PMID:38041802
Abstract

On the path of persisting Moore's Law, one of the biggest obstacles is the "Boltzmann tyranny," which defines the lower limit of power consumption of individual transistors. Negative capacitance (NC) in ferroelectrics could provide a solution and has garnered significant attention in the fields of nanoelectronics, materials science, and solid-state physics. Molecular ferroelectrics, as an integral part of ferroelectrics, have developed rapidly in terms of both performance and functionality, with their inherent advantages such as easy fabrication, mechanical flexibility, low processing temperature, and structural tunability. However, studies on the NC in molecular ferroelectrics are limited. In this study, the focus is centered on the fabricated high-quality thin films of trimethylchloromethyl ammonium trichlorocadmium(II), and a pioneering investigation on their NC responses is conducted. The findings demonstrate that the NC exhibited by molecular ferroelectrics is comparable to that of conventional HfO -based ferroelectrics. This underscores the potential of molecular material systems for next-generation electronic devices.

摘要

在坚持摩尔定律的道路上,最大的障碍之一是“玻尔兹曼暴政”,它定义了单个晶体管功耗的下限。铁电体中的负电容(NC)可能提供一种解决方案,并在纳米电子学、材料科学和固态物理学领域引起了广泛关注。分子铁电体作为铁电体的一个组成部分,在性能和功能方面都得到了迅速发展,具有易于制造、机械柔韧性、低加工温度和结构可调性等固有优点。然而,关于分子铁电体中负电容的研究有限。在本研究中,重点集中在制备高质量的三甲基氯甲基铵三氯镉(II)薄膜,并对其负电容响应进行了开创性研究。研究结果表明,分子铁电体表现出的负电容与传统的基于HfO的铁电体相当。这凸显了分子材料系统在下一代电子器件中的潜力。

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