Mayerhöfer Thomas G, Costa William D P, Popp Jürgen
Department of Spectroscopy/Imaging, Leibniz Institute of Photonic Technology (IPHT), Jena, Germany.
Institute of Physical Chemistry and Abbe Center of Photonics, Friedrich Schiller University, Jena, Germany.
Appl Spectrosc. 2024 Mar;78(3):321-328. doi: 10.1177/00037028231219528. Epub 2024 Jan 23.
The most common mid-infrared (MIR) attenuated total reflection (ATR) accessory has a nominal angle of incidence of 45° and does not have a polarizer. A spectrum recorded with such an accessory does not hold enough information for the sophisticated ATR correction of MIR spectra with strong peaks, which are often strongly affected by refractive index changes due to anomalous dispersion. Here we show that a 45° ATR spectrum recorded without a polarizer and the polarization angle for the same ATR Fourier transform infrared spectroscopy system provide enough information to determine the ATR -polarized spectrum. Further analysis with an improved non-iterative Kramers-Kronig analysis immediately yields the complex refractive index function. The analysis is about two orders of magnitude faster than iterative formalism and runs within seconds on a typical office PC. The effectiveness of our advanced ATR correction formalism is showcased through its application to water, employing diamond, ZnSe, and Ge ATR crystals, along with two distinct ATR accessories. Additionally, the formalism is applied to octadecane spectra. Potential sources of errors such as incidence angle spread, dispersion of the polarization angle, and the influence of reflection at the air/ATR crystal interface are investigated by simulations.
最常见的中红外(MIR)衰减全反射(ATR)附件的标称入射角为45°,且没有偏振器。用这种附件记录的光谱对于具有强峰的MIR光谱进行复杂的ATR校正而言,所包含的信息不足,这些强峰通常会因反常色散导致的折射率变化而受到强烈影响。在此我们表明,对于同一ATR傅里叶变换红外光谱系统,在没有偏振器的情况下记录的45° ATR光谱以及偏振角可提供足够的信息来确定ATR偏振光谱。通过改进的非迭代克莱默斯 - 克朗尼格分析进行进一步分析,可立即得出复折射率函数。该分析比迭代形式主义快约两个数量级,在典型的办公电脑上只需几秒钟就能运行完成。我们先进的ATR校正形式主义的有效性通过其在水的应用中得以展示,使用了金刚石、ZnSe和Ge ATR晶体,以及两种不同的ATR附件。此外,该形式主义还应用于十八烷光谱。通过模拟研究了诸如入射角扩展、偏振角色散以及空气/ATR晶体界面反射的影响等潜在误差源。