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基于量子气体的纳米线渗流网络中有源电流密度的直接映射

Quantum Gas-Enabled Direct Mapping of Active Current Density in Percolating Networks of Nanowires.

作者信息

Fekete Julia, Joshi Poppy, Barrett Thomas J, James Timothy Martin, Shah Robert, Gadge Amruta, Bhumbra Shobita, Evans William, Tripathi Manoj, Large Matthew, Dalton Alan B, Oručević Fedja, Krüger Peter

机构信息

Department of Physics and Astronomy, School of Mathematical and Physical Sciences, University of Sussex, Brighton BN1 9QH, United Kingdom.

Physikalisch-Technische Bundesanstalt, 10587 Berlin, Germany.

出版信息

Nano Lett. 2024 Jan 31;24(4):1309-1315. doi: 10.1021/acs.nanolett.3c04190. Epub 2024 Jan 23.

DOI:10.1021/acs.nanolett.3c04190
PMID:38258741
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC10835730/
Abstract

Electrically percolating nanowire networks are among the most promising candidates for next-generation transparent electrodes. Scientific interest in these materials stems from their intrinsic current distribution heterogeneity, leading to phenomena like percolating pathway rerouting and localized self-heating, which can cause irreversible damage. Without an experimental technique to resolve the current distribution and an underpinning nonlinear percolation model, one relies on empirical rules and safety factors to engineer materials. We introduce Bose-Einstein condensate microscopy to address the longstanding problem of imaging active current flow in 2D materials. We report on performance improvement of this technique whereby observation of dynamic redistribution of current pathways becomes feasible. We show how this, combined with existing thermal imaging methods, eliminates the need for assumptions between electrical and thermal properties. This will enable testing and modeling individual junction behavior and hot-spot formation. Investigating both reversible and irreversible mechanisms will contribute to improved performance and reliability of devices.

摘要

电渗流纳米线网络是下一代透明电极最有前景的候选材料之一。对这些材料的科学兴趣源于其固有的电流分布不均匀性,这会导致诸如渗流路径重新路由和局部自热等现象,进而可能造成不可逆转的损害。在没有解析电流分布的实验技术和基础非线性渗流模型的情况下,人们只能依靠经验法则和安全系数来设计材料。我们引入玻色 - 爱因斯坦凝聚显微镜来解决二维材料中活性电流流动成像这一长期存在的问题。我们报告了该技术的性能改进,通过此改进,电流路径动态重新分布的观测变得可行。我们展示了这一技术与现有的热成像方法相结合,如何消除了对电学和热学性质之间假设的需求。这将使测试和建模单个结行为以及热点形成成为可能。研究可逆和不可逆机制将有助于提高器件的性能和可靠性。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3f97/10835730/7d6848a539f0/nl3c04190_0005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3f97/10835730/270c0b222f6c/nl3c04190_0001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3f97/10835730/116b1acf7044/nl3c04190_0002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3f97/10835730/618ca267987b/nl3c04190_0003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3f97/10835730/66a2694e5321/nl3c04190_0004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3f97/10835730/7d6848a539f0/nl3c04190_0005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3f97/10835730/270c0b222f6c/nl3c04190_0001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3f97/10835730/116b1acf7044/nl3c04190_0002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3f97/10835730/618ca267987b/nl3c04190_0003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3f97/10835730/66a2694e5321/nl3c04190_0004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3f97/10835730/7d6848a539f0/nl3c04190_0005.jpg

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本文引用的文献

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