Large Matthew J, Burn Jake, King Alice A, Ogilvie Sean P, Jurewicz Izabela, Dalton Alan B
University of Surrey, Department of Physics, Guildford, GU2 7XH, United Kingdom.
University of Sussex, Department of Physics, Brighton, BN1 9RH, United Kingdom.
Sci Rep. 2016 May 9;6:25365. doi: 10.1038/srep25365.
We demonstrate that the optoelectronic properties of percolating thin films of silver nanowires (AgNWs) are predominantly dependent upon the length distribution of the constituent AgNWs. A generalized expression is derived to describe the dependence of both sheet resistance and optical transmission on this distribution. We experimentally validate the relationship using ultrasonication to controllably vary the length distribution. These results have major implications where nanowire-based films are a desirable material for transparent conductor applications; in particular when application-specific performance criteria must be met. It is of particular interest to have a simple method to generalize the properties of bulk films from an understanding of the base material, as this will speed up the optimisation process. It is anticipated that these results may aid in the adoption of nanowire films in industry, for applications such as touch sensors or photovoltaic electrode structures.
我们证明，银纳米线（AgNWs）渗流薄膜的光电特性主要取决于组成AgNWs的长度分布。推导了一个广义表达式来描述薄膜电阻和光传输对这种分布的依赖性。我们通过超声处理可控地改变长度分布，对该关系进行了实验验证。这些结果对于基于纳米线的薄膜是透明导体应用的理想材料的情况具有重大意义；特别是在必须满足特定应用性能标准时。拥有一种从对基础材料的理解来概括块状薄膜特性的简单方法特别有意义，因为这将加速优化过程。预计这些结果可能有助于纳米线薄膜在工业中的应用，如触摸传感器或光伏电极结构等应用。
