Modi Mohammed H, Gupta Rajkumar, Gupta Shruti, Yadav Praveen Kumar, Kant Chander, Lal Sohan, Raghuvanshi V K, Kane S R
Accelerator Physics and Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore 452 013, India.
Homi Bhabha National Institute, Anushakti Nagar, Mumbai 400094, India.
Rev Sci Instrum. 2024 Feb 1;95(2). doi: 10.1063/5.0190169.
A versatile beamline for performing reflectivity, fluorescence, and absorption experiments in the soft x-ray region of 100-1500 eV is commissioned on a bending magnet port of the Indus-2 synchrotron source. A high vacuum 2-axis reflectometer with x, y, and z sample scanning stages is installed. This reflectometer is used to measure the reflectivity of large samples up to 300 mm in length and 5 kg in weight. This feature is useful for characterizing x-ray optical elements, such as mirrors, gratings, and multilayers. A flange mounted silicon drift detector is installed in the downstream of the reflectometer for soft x-ray fluorescence measurements. The soft x-ray absorption measurements are carried out in the total electron yield and partial fluorescence yield modes. Integration of three different experimental techniques in the experimental station makes the beamline versatile for materials science applications as it provides structural, chemical, and electronic state information by performing the required experiments in an identical environment. The beamline uses a varied line spacing plane grating monochromator and gives a high flux (∼109 to 1011 photon/s) with a moderate resolution (λ/Δλ ~1000-5000). A three-mirror-based higher harmonic setup is incorporated to get rid of harmonics and to get a high spectral purity monochromatic beam with less than 0.1% harmonic content. In the present article, the beamline optical scheme, mechanical configuration, and details of the experimental setups are presented, along with a few representative results of each experimental mode.
一台多功能光束线在Indus-2同步辐射源的弯铁端口投入使用，可在100 - 1500 eV的软X射线区域进行反射率、荧光和吸收实验。安装了一台带有x、y和z样品扫描台的高真空双轴反射仪。该反射仪用于测量长度达300 mm、重量达5 kg的大尺寸样品的反射率。这一特性对于表征X射线光学元件，如镜子、光栅和多层膜非常有用。在反射仪下游安装了一个法兰安装的硅漂移探测器，用于软X射线荧光测量。软X射线吸收测量在总电子产额和部分荧光产额模式下进行。实验站集成了三种不同的实验技术，使得该光束线在材料科学应用中具有通用性，因为它可以在相同环境中通过进行所需实验来提供结构、化学和电子态信息。该光束线使用可变线间距平面光栅单色仪，能提供高通量（~109至1011光子/秒）和中等分辨率（λ/Δλ ~1000 - 5000）。采用了基于三镜的高次谐波装置来消除谐波，并获得谐波含量小于0.1%的高光谱纯度单色光束。在本文中，介绍了光束线的光学方案、机械配置和实验装置的细节，以及每种实验模式的一些代表性结果。
