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某些反尖晶石氧化物中阳离子的2芯能级X射线光电子能谱成分的一种解释。

An interpretation for the components of 2core level x-ray photoelectron spectra of the cations in some inverse spinel oxides.

作者信息

Subedi Arjun, Yang Detian, Chin Wai Kiat, Tamang Binny, Sahoo Sushrisangita, Yancey Paul, Mahbub Rifat, Shield Jeffrey, Lai Rebecca Y, Xu Xiaoshan, Dowben Peter A, Rangari Vijaya

机构信息

Department of Physics and Astronomy, Theodore Jorgensen Hall, University of Nebraska-Lincoln, 855 North 16th Street, Lincoln, NE 68588-0299, United States of America.

Department of Chemistry, Hamilton Hall, University of Nebraska-Lincoln, Lincoln, NE 68588-0304, United States of America.

出版信息

J Phys Condens Matter. 2024 Apr 12;36(28). doi: 10.1088/1361-648X/ad3271.

Abstract

In an effort to reconcile the various interpretations for the cation components of the 2observed in x-ray photoelectron spectroscopy (XPS) of several spinel oxide materials, the XPS spectra of both spinel alloy nanoparticles and crystalline thin films are compared. We observed that different components of the 2core level XPS spectra, of these inverse spinel thin films, are distinctly surface and bulk weighted, indicating surface-to-bulk core level shifts in the binding energies. Surface-to-bulk core level shifts in binding energies of Ni and Fe 2core levels of NiFeOthin film are observed in angle-resolved XPS. The ratio between surface-weighted components and bulk-weighted components of the Ni and Fe core levels shows appreciable dependency on photoemission angle, with respect to surface normal. XPS showed that the ferrite nanoparticles NiCoFeO(= 0.2, 0.5, 0.8, 1) resemble the surface of the NiFeOthin film. Surface-to-bulk core level shifts are also observed in CoFeOand NiCoOthin films but not as significantly as in NiFeOthin film. Estimates of surface stoichiometry of some spinel oxide nanoparticles and thin films suggested that the apportionment between cationic species present could be farther from expectations for thin films as compared to what is seen with nanoparticles.

摘要

为了协调对几种尖晶石氧化物材料进行X射线光电子能谱(XPS)分析时观察到的2中阳离子成分的各种解释,对尖晶石合金纳米颗粒和晶体薄膜的XPS光谱进行了比较。我们观察到,这些反尖晶石薄膜的2个核心能级XPS光谱的不同成分具有明显的表面和体相权重,表明结合能存在表面到体相的核心能级位移。在角分辨XPS中观察到NiFeO薄膜的Ni和Fe 2个核心能级结合能的表面到体相核心能级位移。Ni和Fe核心能级的表面加权成分与体相加权成分之间的比例显示出对相对于表面法线的光发射角度有明显的依赖性。XPS表明,铁氧体纳米颗粒NiCoFeO(= 0.2、0.5、0.8、1)类似于NiFeO薄膜的表面。在CoFeO和NiCoO薄膜中也观察到表面到体相的核心能级位移,但不如在NiFeO薄膜中明显。对一些尖晶石氧化物纳米颗粒和薄膜的表面化学计量的估计表明,与纳米颗粒相比,薄膜中阳离子物种之间的分配可能更偏离预期。

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