Department of Neurosurgery and Brain Repair, Morsani School of Medicine, University of South Florida, Tampa, Florida, USA.
Department of Radiology, Morsani School of Medicine, University of South Florida, Tampa, Florida, USA.
J Med Radiat Sci. 2024 Sep;71(3):461-473. doi: 10.1002/jmrs.775. Epub 2024 Mar 11.
Intracranial electroencephalography (iEEG) involves placing intracranial electrodes to localise seizures in patients with medically refractory epilepsy. While magnetic resonance imaging (MRI) enables visualisation of electrodes within patient-specific anatomy, the safety of these electrodes must be confirmed prior to routine clinical utilisation. Therefore, the purpose of this study was to evaluate the safety of iEEG electrodes from a particular manufacturer in a 3.0-Tesla (3.0T) MRI environment.
Measurements of magnetically induced displacement force and torque were determined for each of the 10 test articles using standardised techniques. Test articles were subsequently evaluated for radiofrequency-induced heating using a Perspex phantom in both open and 'fault' conditions. Additionally, we assessed radiofrequency (RF)-induced heating with all test articles placed into the phantom simultaneously to simulate an implantation, again in both open and 'fault' conditions. Finally, each test article was evaluated for MRI artefacts.
The magnetically induced displacement force was found to be less than the force on the article due to gravity for all test articles. Similarly, the maximum magnetically induced torque was less than the worst-case torque due to gravity for all test articles apart from the 8-contact strip - for which it was 11% greater - and the depthalon cap. The maximum temperature change for any portion of any test article assessed individually was 1.7°C, or 1.2°C for any device component meant to be implanted intracranially. In the implantation configuration, the maximum recorded temperature change was 0.7°C.
MRI may be safely performed for localising iEEG electrodes at 3.0T under certain conditions.
颅内脑电图(iEEG)涉及在药物难治性癫痫患者中放置颅内电极以定位癫痫发作。虽然磁共振成像(MRI)能够可视化患者特定解剖结构内的电极,但在常规临床使用之前必须确认这些电极的安全性。因此,本研究的目的是评估特定制造商的 iEEG 电极在 3.0 特斯拉(3.0T)MRI 环境中的安全性。
使用标准技术确定了 10 个测试品中每个测试品的磁感应位移力和扭矩的测量值。随后,使用有机玻璃模型在开和“故障”两种情况下评估测试品的射频(RF)感应加热情况。此外,我们还评估了所有测试品同时置于模型中以模拟植入情况时的 RF 感应加热情况,同样在开和“故障”两种情况下进行。最后,评估了每个测试品的 MRI 伪影。
对于所有测试品,磁感应位移力均小于因重力作用于测试品的力。同样,除 8 触点条(最大磁感应扭矩比因重力作用的扭矩高 11%)和深度铝帽外,对于所有测试品,最大磁感应扭矩均小于因重力作用的最坏情况扭矩。单独评估的任何测试品的任何部分的最大温度变化为 1.7°C,或任何要植入颅内的设备部件的最大温度变化为 1.2°C。在植入配置中,记录到的最大温度变化为 0.7°C。
在某些条件下,3.0T 下可安全进行 iEEG 电极的 MRI 定位。