Ali Azmat, Cruguel Herve, Giangrisostomi Erika, Ovsyannikov Ruslan, Silly Mathieu G, Dudy Lenart, Cappel Ute B, Lhuillier Emmanuel, Witkowski Nadine, Johansson Fredrik O L
Sorbonne Université, CNRS, Institut des Nanosciences de Paris, INSP, F-75005, Paris, France.
Institute Methods and Instrumentation for Synchrotron Radiation Research PS-ISRR, Helmholtz Berlin für Materialien und Energie, Albert-Einstein-Straße 15, 12489, Berlin, Germany.
J Phys Chem Lett. 2024 Apr 11;15(14):3721-3727. doi: 10.1021/acs.jpclett.4c00139. Epub 2024 Mar 28.
The understanding of the interfacial properties in perovskite devices under irradiation is crucial for their engineering. In this study we show how the electronic structure of the interface between CsPbBr perovskite nanocrystals (PNCs) and Au is affected by irradiation of X-rays, near-infrared (NIR), and ultraviolet (UV) light. The effects of X-ray and light exposure could be differentiated by employing low-dose X-ray photoelectron spectroscopy (XPS). Apart from the common degradation product of metallic lead (Pb), a new intermediate component (Pb) was identified in the Pb 4f XPS spectra after exposure to high intensity X-rays or UV light. The Pb component is determined to be monolayer metallic Pb on-top of the Au substrate from underpotential deposition (UPD) of Pb induced from the breaking of the perovskite structure allowing for migration of Pb.
了解钙钛矿器件在辐照下的界面特性对其工程应用至关重要。在本研究中,我们展示了CsPbBr钙钛矿纳米晶体(PNC)与Au之间界面的电子结构如何受到X射线、近红外(NIR)和紫外(UV)光辐照的影响。通过使用低剂量X射线光电子能谱(XPS)可以区分X射线和光照的影响。除了常见的金属铅(Pb)降解产物外,在暴露于高强度X射线或紫外光后的Pb 4f XPS光谱中还鉴定出一种新的中间成分(Pb)。通过钙钛矿结构破坏导致Pb迁移而引发的Pb欠电位沉积(UPD),确定该Pb成分是Au衬底上的单层金属Pb。