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通过铟铋碲纳米片实现宽带室温光电探测

Broadband Room-Temperature Photodetection via InBiTe Nanosheet.

作者信息

Chen Shijie, Wu Tuntan, Chen Hang, Zhou Wei, Gao Yanqing, Yao Niangjuan, Jiang Lin, Huang Zhiming

机构信息

Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, 1 Sub-Lane Xiangshan, Hangzhou, 310024, P. R. China.

State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083, P. R. China.

出版信息

Small. 2024 Aug;20(33):e2312219. doi: 10.1002/smll.202312219. Epub 2024 Apr 19.

Abstract

Broadband room-temperature photodetection has become a pressing need as application requirements for communication, imaging, spectroscopy, and sensing have evolved. Topological insulators (TIs) have narrow bandgap structures with a wide absorption spectral response range, which should meet the requirements of broadband detection. However, owing to their high carrier concentration and low carrier mobility resulting in poor noise equivalent power (NEP), they are generally considered unsuitable for photodetection. Here, InBiTe alloy nanosheet formed by doping InTe into BiTe(≈ 1:1) is utilized, effectively improving carrier mobility by over ten times while maintaining a narrow bandgap structure, to fabricate a broadband photodetector covering a wide response range from visible to millimeter wave (MMW). Under the synergistic multi-mechanism of the photoelectric effect in the visible-infrared region and the electromagnetic-induced potential well (EIW) effect in Terahertz band, the performance of NEP = 75 pW Hz and response time τ ≈100 µs in visible to infrared band and the performance of NEP = 6.7 × 10 pW Hz, τ ≈8 µs in Terahertz region are achieved. The results demonstrate the promising prospects of topological insulator alloy (like InBiTe) nanosheet in optoelectronic detection applications and provide a direction for the research into high-performance broadband photoelectric detectors via TIs.

摘要

随着通信、成像、光谱学和传感等应用需求的不断发展,宽带室温光电探测已成为迫切需求。拓扑绝缘体(TIs)具有窄带隙结构和宽吸收光谱响应范围,应能满足宽带探测的要求。然而,由于其高载流子浓度和低载流子迁移率导致噪声等效功率(NEP)较差,它们通常被认为不适合用于光电探测。在此,通过将InTe掺杂到BiTe(≈1:1)中形成的InBiTe合金纳米片被加以利用,在保持窄带隙结构的同时,有效地将载流子迁移率提高了十多倍,以制造一种覆盖从可见光到毫米波(MMW)宽响应范围的宽带光电探测器。在可见光-红外区域的光电效应和太赫兹波段的电磁感应势阱(EIW)效应的协同多机制作用下,在可见光到红外波段实现了NEP = 75 pW Hz和响应时间τ≈100 µs的性能,在太赫兹区域实现了NEP = 6.7×10 pW Hz、τ≈8 µs的性能。结果证明了拓扑绝缘体合金(如InBiTe)纳米片在光电探测应用中的广阔前景,并为通过拓扑绝缘体研究高性能宽带光电探测器提供了方向。

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