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里夫希茨转变对CuN单层本征电阻率的影响。

Influence of Lifshitz Transition on the Intrinsic Resistivity of CuN Monolayer.

作者信息

Zhang Huiwen, Zhu Mingfeng, Zheng Yisong

机构信息

Key Laboratory of Physics and Technology for Advanced Batteries (Ministry of Education), College of Physics, Jilin University, Changchun 130012, China.

出版信息

J Phys Chem Lett. 2024 May 16;15(19):5143-5149. doi: 10.1021/acs.jpclett.4c00777. Epub 2024 May 6.

DOI:10.1021/acs.jpclett.4c00777
PMID:38710012
Abstract

The Lifshitz transition (LT), a topological structure transition of Fermi surfaces, can induce various intricate physical properties in metallic materials. In this study, through first-principles calculations, we explore the nontrivial effect of the LT on the intrinsic resistivity of the CuN monolayer arising from electron-phonon (el-ph) scattering. We find that when the LT is induced by electron doping, the multibranch Fermi surface simplifies into a single-band profile. Such an LT leads to a decoupling of low-frequency flexural phonons from el-ph scattering due to mirror symmetry. Consequently, the resistivity of the CuN monolayer at room temperature significantly decreases, approaching that of slightly doped graphene, and highlighting the CuN monolayer as a highly conductive two-dimensional metal. Moreover, this LT can bring about a nonlinear temperature dependence of the intrinsic resistivity at a high temperature.

摘要

里夫希茨转变(LT)是费米面的一种拓扑结构转变,能够在金属材料中诱导出各种复杂的物理性质。在本研究中,通过第一性原理计算,我们探究了LT对CuN单层膜本征电阻率的非平凡效应,该效应源于电子 - 声子(el-ph)散射。我们发现,当通过电子掺杂诱导LT时,多分支费米面简化为单带分布。由于镜面对称性,这种LT导致低频弯曲声子与el-ph散射解耦。因此,CuN单层膜在室温下的电阻率显著降低,接近轻度掺杂石墨烯的电阻率,这突出了CuN单层膜作为一种高导电二维金属的特性。此外,这种LT能够在高温下使本征电阻率呈现非线性温度依赖性。

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