Narayanan Deeparekha, Martinez Alan, Martin Ulises, Mansoor Bilal, Case Raymundo, Castaneda Homero
Department of Materials Science and Engineering, Texas A&M University, College Station, TX 77843 USA.
Texas A&M University at Qatar, Doha, Qatar.
Npj Mater Degrad. 2024;8(1):50. doi: 10.1038/s41529-024-00468-4. Epub 2024 May 10.
In this work, the passivation and localized corrosion of selective laser melted (SLM) stainless steel 316 L when exposed to high pressures of CO with the presence of HS and Cl at 25 °C and 125 °C were studied. Depletion of Cr/Mo was observed at the cell interiors and melt-pool boundaries (MPBs) compared to the cell boundaries. Volta potential differences obtained from scanning Kelvin probe force microscopy (SKPFM) showed that the MPBs were 8-20 mV lower than the matrix, while the cell interiors were 20-50 mV lower than the cell boundaries. Electrochemical impedance spectroscopy (EIS) and Mott-Schottky tests indicated a more defective passive film at 125 °C, and X-ray photoelectron spectroscopy (XPS) confirmed the formation of a less protective film with an increased S/O ratio at 125 °C than 25 °C. Initiation of localized corrosion was observed at the MPBs and pits formed after a week of immersion were wider by an order of magnitude at 125 °C than 25 °C, with evidence of cell-interior dissolution. While passivity was observed even at elevated temperatures, local chemical heterogeneities compromised the stability of the film and contributed to localized corrosion in SLM SS316L.
在本研究中,对选择性激光熔化(SLM)的316 L不锈钢在25 °C和125 °C下暴露于含有HS和Cl的高压CO环境中的钝化和局部腐蚀情况进行了研究。与晶胞边界相比,在晶胞内部和熔池边界(MPB)处观察到Cr/Mo的贫化。通过扫描开尔文探针力显微镜(SKPFM)获得的伏打电位差表明,MPB比基体低8 - 20 mV,而晶胞内部比晶胞边界低20 - 50 mV。电化学阻抗谱(EIS)和莫特 - 肖特基测试表明,在125 °C时钝化膜的缺陷更多,X射线光电子能谱(XPS)证实,与25 °C相比,在125 °C时形成的保护性较差的膜的S/O比增加。在MPB处观察到局部腐蚀的起始,浸泡一周后形成的点蚀在125 °C时比25 °C时宽一个数量级,并有晶胞内部溶解的迹象。虽然即使在高温下也观察到了钝化现象,但局部化学不均匀性损害了膜的稳定性,并导致了SLM SS316L中的局部腐蚀。