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单激光超分辨率成像的三维漂移校正

3D drift correction for super-resolution imaging with a single laser light.

作者信息

Li Yunze, He Yingchuan, Fang Ke, Zhou Lulu, Wang Zhen, Shi Wei, Li Yiming

出版信息

Opt Lett. 2024 May 15;49(10):2785-2788. doi: 10.1364/OL.519290.

Abstract

Single-molecule localization microscopy (SMLM) enables three-dimensional (3D) super-resolution imaging of nanoscale structures within biological samples. However, prolonged acquisition introduces a drift between the sample and the imaging system, resulting in artifacts in the reconstructed super-resolution image. Here, we present a novel, to our knowledge, 3D drift correction method that utilizes both the reflected and scattered light from the sample. Our method employs the reflected light of a near-infrared (NIR) laser for focus stabilization while synchronously capturing speckle images to estimate the lateral drift. This approach combines high-precision active compensation in the axial direction with lateral post-processing compensation, achieving the abilities of 3D drift correction with a single laser light. Compared to the popular localization events-based cross correlation method, our approach is much more robust, especially for datasets with sparse localization points.

摘要

单分子定位显微镜(SMLM)能够对生物样品中的纳米级结构进行三维(3D)超分辨率成像。然而,长时间采集会导致样品与成像系统之间产生漂移,从而在重建的超分辨率图像中产生伪影。在此,据我们所知,我们提出了一种新颖的三维漂移校正方法,该方法利用了来自样品的反射光和散射光。我们的方法采用近红外(NIR)激光的反射光进行聚焦稳定,同时同步捕获散斑图像以估计横向漂移。这种方法将轴向的高精度主动补偿与横向后处理补偿相结合,实现了用单一激光进行三维漂移校正的能力。与流行的基于定位事件的互相关方法相比,我们的方法更加稳健,特别是对于定位点稀疏的数据集。

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