Colonnier M, Beaulieu C
J Comp Neurol. 1985 Jan 8;231(2):175-9. doi: 10.1002/cne.902310205.
Known quantities of test objects approximating the parameters of cortical synapses were embedded in known volumes of a transparent embedding medium. The material was cut in slabs of appropriate thickness. The mean trace length (d) of the profiles of the test objects was measured and the number of profiles per unit area (NA) was calculated. Various stereological formulae were applied to these data to determine the number of test objects per unit volume (NV). For large numbers of those test objects most closely approximating the parameters of cortical synapses, the formula NV = NA/d and the DeHoff and Rhines formula ('61) for polydispersed circular disks NV = 8NAZ/ pi 2 (where Z is the mean of the reciprocals of the trace lengths) gave accurate results (error less than or equal to 5%). Other popular formulae and procedures were not as accurate and underestimated their number by as much as 32%.
将已知数量的、近似皮质突触参数的测试对象嵌入已知体积的透明包埋介质中。将该材料切成适当厚度的薄片。测量测试对象轮廓的平均轨迹长度（d），并计算每单位面积的轮廓数（NA）。将各种体视学公式应用于这些数据，以确定每单位体积的测试对象数量（NV）。对于大量最接近皮质突触参数的测试对象，公式NV = NA/d以及用于多分散圆盘的DeHoff和Rhines公式（'61）NV = 8NAZ/π²（其中Z是轨迹长度倒数的平均值）给出了准确的结果（误差小于或等于5%）。其他常用的公式和程序则不那么准确，低估数量多达32%。
