Identifying plant traits to increase wheat yield under irrigated conditions.

Crop models have frequently been used to identify desired plant traits for rainfed wheat ( L.). However, efforts to apply these models to irrigated wheat grown under non-limiting water and nitrogen conditions have been rare. Using simulation models to identify plant traits that impact yield can facilitate more targeted cultivar improvement and reduce time and cost. In this study, the SSM-iCrop model was employed to identify effective plant traits for increasing the yield of irrigated wheat in four distinct environments in Iran. A comprehensive range of traits related to phenology, leaf area development, dry matter production, and yield formation, which exhibited reported genetic variation, were tested. The impact of these traits on yield showed slight variation across different environmental zones due to genetic × environment interaction. However, across all environments, modifying current cultivars to increase radiation use efficiency (RUE) resulted in a 19 % increase in yield, accelerating leaf area development led to a 10 %-15 % increase, lengthening the grain filling period resulted in a 14 % increase, and extending the vegetative period led to a 6 % increase. These improvements were all statistically significant. Considering that longer duration cultivars may disrupt cropping systems and the need to develop simple methods for targeting and phenotyping RUE, faster leaf area development was found as the most promising option to increase irrigated wheat yield under optimal water and nitrogen management within a short time frame. It should be noted that cultivars with modified traits needed higher water and nitrogen inputs to support increased yields. These findings can be applied to select desirable key traits for targeted breeding and expedite the production of high-yielding cultivars of irrigated wheat in various environmental zones. The potential for further improvement through combined traits requires further investigation.