Kuan Aaron T, Phan Sébastien, Kim Keun-Young, Mackey Mason, Kim Minsu, Peltier Steven T, Ellisman Mark, Lee Wei-Chung Allen
Department of Neurobiology, Harvard Medical School, Boston, MA, USA.
Present address: Department of Neuroscience, Yale School of Medicine, New Haven, CT, USA.
bioRxiv. 2024 Jun 6:2024.06.05.597487. doi: 10.1101/2024.06.05.597487.
We demonstrate limited-tilt, serial section electron tomography (ET), which can non-destructively map brain circuits over large 3D volumes and reveal high-resolution, supramolecular details within subvolumes of interest. We show accelerated ET imaging of thick sections (>500 nm) with the capacity to resolve key features of neuronal circuits including chemical synapses, endocytic structures, and gap junctions. Furthermore, we systematically assessed how imaging parameters affect image quality and speed to enable connectomic-scale projects.
我们展示了有限倾斜连续切片电子断层扫描（ET）技术，该技术能够在大三维体积上无损绘制脑回路，并揭示感兴趣子体积内的高分辨率超分子细节。我们展示了对厚切片（>500纳米）的加速ET成像，其能够分辨神经元回路的关键特征，包括化学突触、内吞结构和缝隙连接。此外，我们系统评估了成像参数如何影响图像质量和速度，以推动连接组规模的项目。
