Dutta M, Kalita J M, Wary G
Department of Physics, Cotton University, Guwahati, 781001, India.
J Fluoresc. 2025 Jun;35(6):4399-4408. doi: 10.1007/s10895-024-03836-0. Epub 2024 Jul 16.
We study concentration quenching and energy transfer mechanisms of yttrium oxide (YO) nanomaterials doped with different concentrations (0-5 mol%) of cerium (Ce). Photoluminescence (PL) spectra recorded under an excitation wavelength of 350 nm show a broad emission band at ∼ 406 nm and a feeble emission band at ∼ 463 nm in the undoped YO sample. The doping of Ce in YO induced multiple PL peaks within the blue-green region of the spectrum in all the doped samples with the peak at ∼ 466 nm being notably the prominent one. This prominent emission band exhibits a decrease in intensity with increasing Ce concentration due to concentration quenching. Analysis of Time-resolved photoluminescence (TRPL) spectra reveal that the average emission lifetime of Ce-doped YO is shorter than that of the undoped YO sample. The concentration quenching effect and the decrease of average emission lifetime of the dominant emission band are explained on the basis of energy transfer from the host YO to the Ce ion centres. The critical quenching concentration of Ce ion in YO:Ce phosphor was identified to be 1 mol% and the critical transfer distance was estimated to be 23.74 Å. Analysis reveal that the concentration quenching mechanism involves nearest-neighbour interaction.
我们研究了掺杂不同浓度（0 - 5 mol%）铈（Ce）的氧化钇（YO）纳米材料的浓度猝灭和能量转移机制。在350 nm激发波长下记录的光致发光（PL）光谱显示，未掺杂的YO样品在约406 nm处有一个宽发射带，在约463 nm处有一个微弱发射带。在所有掺杂样品中，Ce掺杂到YO中在光谱的蓝绿色区域内诱导出多个PL峰，其中约466 nm处的峰尤为突出。由于浓度猝灭，这个突出的发射带强度随着Ce浓度的增加而降低。时间分辨光致发光（TRPL）光谱分析表明，Ce掺杂的YO的平均发射寿命比未掺杂的YO样品短。基于从主体YO到Ce离子中心的能量转移，解释了浓度猝灭效应和主导发射带平均发射寿命的降低。确定了YO:Ce荧光粉中Ce离子的临界猝灭浓度为1 mol%，并估计临界转移距离为23.74 Å。分析表明，浓度猝灭机制涉及最近邻相互作用。
