Optbayesexpt: Sequential Bayesian Experiment Design for Adaptive Measurements.
作者信息
McMichael Robert D, Blakley Sean M, Dushenko Sergey
机构信息
National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, MD 20742 USA.
出版信息
J Res Natl Inst Stand Technol. 2021 Feb 3;126:126002. doi: 10.6028/jres.126.002. eCollection 2021.
Abstract
摘要
Zotero 插件