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通过分子束外延法实现块状绝缘(BiSb)Te薄膜和纳米线的选择性区域外延

Selective-Area Epitaxy of Bulk-Insulating (BiSb)Te Films and Nanowires by Molecular Beam Epitaxy.

作者信息

Lippertz Gertjan, Breunig Oliver, Fister Rafael, Uday Anjana, Bliesener Andrea, Brede Jens, Taskin Alexey, Ando Yoichi

机构信息

Physics Institute II, University of Cologne, D-50937 Köln, Germany.

出版信息

ACS Appl Mater Interfaces. 2024 Aug 7;16(31):41293-41299. doi: 10.1021/acsami.4c06146. Epub 2024 Jul 25.

DOI:10.1021/acsami.4c06146
PMID:39051736
Abstract

Selective-area epitaxy (SAE) is a useful technique to grow epitaxial films with a desired shape on a prepatterned substrate. Although SAE of patterned topological-insulator (TI) thin films has been performed in the past, there has been no report of SAE-grown TI structures that are bulk-insulating. Here we report the successful growth of Hall-bars and nanowires of bulk-insulating TIs using the SAE technique. Their transport properties show that the quality of the selectively grown structures is comparable to that of bulk-insulating TI films grown on pristine substrates. In SAE-grown TI nanowires, we were able to observe Aharonov-Bohm-like magnetoresistance oscillations that are characteristic of the quantum-confined topological surface states. The availability of bulk-insulating TI nanostructures via the SAE technique opens the possibility to fabricate intricate topological devices in a scalable manner.

摘要

选择性区域外延(SAE)是一种在预图案化衬底上生长具有所需形状的外延薄膜的有用技术。尽管过去已经进行了图案化拓扑绝缘体(TI)薄膜的SAE,但尚未有关于通过SAE生长的体绝缘TI结构的报道。在此,我们报告了使用SAE技术成功生长体绝缘TI的霍尔条和纳米线。它们的输运特性表明,选择性生长结构的质量与在原始衬底上生长的体绝缘TI薄膜相当。在通过SAE生长的TI纳米线中,我们能够观察到类似阿哈罗诺夫 - 玻姆的磁阻振荡,这是量子限制拓扑表面态的特征。通过SAE技术获得体绝缘TI纳米结构为以可扩展方式制造复杂的拓扑器件开辟了可能性。

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