Blankenship Brian W, Meier Timon, Arvin Sophia Lafia, Li Jingang, Seymour Nathan, De La Torre Natalia, Hsu Brian, Zhao Naichen, Mavrikos Stefanos, Li Runxuan, Grigoropoulos Costas P
Laser Thermal Laboratory, Department of Mechanical Engineering, University of California, Berkeley, Berkeley, California 94720, United States.
ACS Appl Eng Mater. 2024 Apr 15;2(7):1737-1742. doi: 10.1021/acsaenm.4c00160. eCollection 2024 Jul 26.
Defects in microarchitected materials exhibit a dual nature, capable of both unlocking innovative functionalities and degrading their performance. Specifically, while intentional defects are strategically introduced to customize and enhance mechanical responses, inadvertent defects stemming from manufacturing errors can disrupt the symmetries and intricate interactions within these materials. In this study, we demonstrate a nondestructive optical imaging technique that can precisely locate defects inside microscale metamaterials, as well as provide detailed insights on the specific type of defect.
微结构材料中的缺陷具有双重性质，既能够解锁创新功能，也会降低其性能。具体而言，虽然有意引入的缺陷是为了定制和增强机械响应，但制造误差产生的意外缺陷会破坏这些材料内部的对称性和复杂相互作用。在本研究中，我们展示了一种无损光学成像技术，它可以精确地定位微尺度超材料内部的缺陷，并提供有关缺陷具体类型的详细信息。
