Peters Jonathan J P, Reed Bryan W, Jimbo Yu, Noguchi Kanako, Müller Karin H, Porter Alexandra, Masiel Daniel J, Jones Lewys
Advanced Microscopy Laboratory, CRANN, Trinity College Dublin, The University of Dublin, Dublin, Ireland.
School of Physics, Trinity College Dublin, The University of Dublin, Dublin, Ireland.
Science. 2024 Aug 2;385(6708):549-553. doi: 10.1126/science.ado8579. Epub 2024 Aug 1.
An ever-present limitation of transmission electron microscopy is the damage caused by high-energy electrons interacting with any sample. By reconsidering the fundamentals of imaging, we demonstrate an event-responsive approach to electron microscopy that delivers more information about the sample for a given beam current. Measuring the time to achieve an electron count threshold rather than waiting a predefined constant time improves the information obtained per electron. The microscope was made to respond to these events by blanking the beam, thus reducing the overall dose required. This approach automatically apportions dose to achieve a given signal-to-noise ratio in each pixel, eliminating excess dose that is associated with diminishing returns of information. We demonstrate the wide applicability of our approach to beam-sensitive materials by imaging biological tissue and zeolite.
透射电子显微镜一直存在的一个局限性是高能电子与任何样品相互作用所造成的损伤。通过重新审视成像的基本原理，我们展示了一种事件响应式电子显微镜方法，在给定束流条件下能提供更多关于样品的信息。测量达到电子计数阈值的时间而非等待预定义的固定时间，可提高每个电子所获得的信息。通过使电子束消隐，让显微镜对这些事件做出响应，从而降低所需的总剂量。这种方法能自动分配剂量，以在每个像素中实现给定的信噪比，消除与信息回报递减相关的过量剂量。我们通过对生物组织和沸石成像，证明了我们的方法对束敏感材料具有广泛的适用性。
