Walsh Flynn, Zhang Mingwei, Ritchie Robert O, Asta Mark, Minor Andrew M
Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
Sci Adv. 2024 Aug 2;10(31):eadn9673. doi: 10.1126/sciadv.adn9673.
Diffuse intensities in the electron diffraction patterns of concentrated face-centered cubic solid solutions have been widely attributed to chemical short-range order, although this connection has been recently questioned. This article explores the many nonordering origins of commonly reported features using a combination of experimental electron microscopy and multislice diffraction simulations, which suggest that diffuse intensities largely represent thermal and static displacement scattering. A number of observations may reflect additional contributions from planar defects, surface terminations incommensurate with bulk periodicity, or weaker dynamical effects.
尽管最近有人对这种联系提出质疑，但面心立方浓固溶体电子衍射图中的漫射强度广泛归因于化学短程有序。本文结合实验电子显微镜和多层衍射模拟，探讨了常见报道特征的许多非有序起源，结果表明漫射强度很大程度上代表热散射和静态位移散射。一些观察结果可能反映了平面缺陷、与体相周期性不匹配的表面终止或较弱的动力学效应的额外贡献。
