Li Bo, Yan Zhijie, Song Jiaojiao, Gao Yan, Wang Lei, Yan Xiaohan, Shen Huaibin, Fan Fengjia
CAS Key Laboratory of Microscale Magnetic Resonance and School of Physical Sciences, University of Science and Technology of China, Hefei 230026, China.
Hefei National Laboratory, University of Science and Technology of China, Hefei 230088, China.
Nano Lett. 2024 Aug 28;24(34):10650-10655. doi: 10.1021/acs.nanolett.4c03024. Epub 2024 Aug 19.
In situ characterizations of charge injection dynamics, equilibrated concentration, and electric field distributions shed light on the critical mechanisms of quantum dot light-emitting diodes (QD-LEDs). In this work, we developed electrically excited transient absorption spectroscopy, which can provide the above key information, to investigate the efficiency roll-off of QD-LEDs. We found that the average electron populations per QD are low when QD-LEDs exhibit efficiency roll-off, excluding Auger recombination as the main cause. We also revealed that the weak electrical field inside the QD layer under forward biases has a negligible impact on the efficiency. Interestingly, we found that as the voltage increases the electron concentration in the QD layer saturates at very low levels. When combined with the concomitant efficiency roll-off, we propose electron leakage is the main loss at elevated driving voltages. We further demonstrate that increasing the electron confinement potential with the ZnS shell enables us to efficiently mitigate the efficiency roll-off.
电荷注入动力学、平衡浓度和电场分布的原位表征揭示了量子点发光二极管(QD-LED)的关键机制。在这项工作中,我们开发了电激发瞬态吸收光谱,它可以提供上述关键信息,以研究QD-LED的效率滚降。我们发现,当QD-LED表现出效率滚降时,每个量子点的平均电子数很低,排除了俄歇复合作为主要原因。我们还揭示了正向偏压下量子点层内部的弱电场对效率的影响可以忽略不计。有趣的是,我们发现随着电压增加,量子点层中的电子浓度在非常低的水平饱和。结合伴随的效率滚降,我们提出电子泄漏是高驱动电压下的主要损耗。我们进一步证明,用ZnS壳层增加电子限制势能够有效减轻效率滚降。