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基于三维微纳集成碳纳米管结构的测热红外光响应。

Bolometric IR photoresponse based on a 3D micro-nano integrated CNT architecture.

作者信息

Al-Mafrachi Yasameen, Yadav Sandeep, Preu Sascha, Schneider Jörg J, Yilmazoglu Oktay

机构信息

Department of Electrical Engineering and Information Technology, Institute for Microwave Engineering and Photonics (IMP), Technical University of Darmstadt, 64283 Darmstadt, Germany.

Eduard-Zintl-Institut für Anorganische und Physikalische Chemie, Technical University of Darmstadt, 64287 Darmstadt, Germany.

出版信息

Beilstein J Nanotechnol. 2024 Aug 15;15:1030-1040. doi: 10.3762/bjnano.15.84. eCollection 2024.

Abstract

A new 3D micro-nano integrated M-shaped carbon nanotube (CNT) architecture was designed and fabricated. It is based on vertically aligned carbon nanotube arrays composed of low-density, mainly double-walled CNTs with simple lateral external contacts to the surroundings. Standard optical lithography techniques were used to locally tailor the width of the vertical block structure. The complete sensor system, based on a broadband blackbody absorber region and a high-resistance thermistor region, can be fabricated in a single chemical vapor deposition process step. The thermistor resistance is mainly determined by the high junction resistances of the adjacent aligned CNTs. This configuration also provides low lateral thermal conductivity and a high temperature coefficient of resistance (TCR). These properties are advantageous for new bolometric sensors with high voltage responsivity and broadband absorption from the infrared (IR) to the terahertz spectrum. Preliminary performance evaluations have shown current and voltage responsivities of 2 mA/W and 30 V/W, respectively, in response to IR (980 nm) absorption for a 20 × 20 μm device. The device exhibits an exceptionally fast response time of ≈0.15 ms, coupled with a TCR of -0.91 %/K. These attributes underscore its high operating speed and responsivity, respectively. In particular, the device maintains excellent thermal stability and reliable operation at elevated temperatures in excess of 200 °C, extending its potential utility in challenging environmental conditions. This design allows for further device miniaturization using optical lithography techniques. Its unique properties for mass production through large-scale integration techniques make it important for real-time broadband imaging systems.

摘要

设计并制造了一种新型的三维微纳集成M形碳纳米管(CNT)结构。它基于垂直排列的碳纳米管阵列,该阵列由低密度的主要为双壁碳纳米管组成,与周围环境具有简单的横向外部接触。采用标准光刻技术对垂直块结构的宽度进行局部定制。基于宽带黑体吸收区域和高电阻热敏电阻区域的完整传感器系统可以在单个化学气相沉积工艺步骤中制造。热敏电阻的电阻主要由相邻排列的碳纳米管的高结电阻决定。这种配置还提供了低横向热导率和高电阻温度系数(TCR)。这些特性对于具有高电压响应率以及从红外(IR)到太赫兹光谱的宽带吸收的新型测辐射热传感器是有利的。初步性能评估表明,对于一个20×20μm的器件,在响应红外(980nm)吸收时,电流响应率和电压响应率分别为2mA/W和30V/W。该器件表现出异常快的响应时间,约为0.15ms,TCR为-0.91%/K。这些特性分别突出了其高工作速度和响应率。特别是,该器件在超过200°C的高温下保持了优异的热稳定性和可靠的运行,扩展了其在具有挑战性的环境条件下的潜在用途。这种设计允许使用光刻技术进一步缩小器件尺寸。其通过大规模集成技术进行大规模生产的独特特性使其对于实时宽带成像系统非常重要。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dbf8/11331537/86c69a873714/Beilstein_J_Nanotechnol-15-1030-g002.jpg

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