Hu Yuqing, Feng Wuwei, Zhang Weixuan, Zhang Yingda, Liu Jinzhang
School of Materials Science and Engineering, Beihang University, Beijing 100083, China.
School of Materials Science and Technology, China University of Geosciences, Beijing 100083, China.
ACS Appl Mater Interfaces. 2024 Sep 18;16(37):49756-49762. doi: 10.1021/acsami.4c09356. Epub 2024 Sep 5.
The polymer dielectric spacer plays a key role in the performance of film capacitors. However, currently, commercial polymer dielectric films generally have low relative dielectric constants (<4) and low capacitive energy storage densities (<3 J cm). Here, we report the use of protonated tetra(aniline) (TANI) molecules with a length of 1.3 nm to improve the energy storage performance of poly(ether imide) (PEI) films. With only a small content of TANI doping, i.e., 0.7 wt %, both the dielectric constant and energy storage density of PEI film can be significantly improved, while the dielectric loss remains as low as that of pure PEI. A maximum energy density of 9.4 J cm is achieved. To manifest the efficacy of protonated TANI, polyaniline and deprotonated TANI are also prepared and used as dopants in PEI. The PANI filler can also increase the dielectric constant, while the dielectric loss is increased as well. The deprotonated TANI doped in PEI has no influence on both the dielectric constant and energy density, implying that the protonated amino groups of TANI molecules are responsible for the enhanced dielectric constant of the PEI/TANI composite. The correlation between protonation of TANI dopants and dielectric properties is discussed in detail.
聚合物介电间隔层在薄膜电容器的性能中起着关键作用。然而，目前商业聚合物介电薄膜通常具有较低的相对介电常数（<4）和较低的电容储能密度（<3 J/cm³）。在此，我们报道了使用长度为1.3 nm的质子化四苯胺（TANI）分子来改善聚醚酰亚胺（PEI）薄膜的储能性能。仅掺杂少量的TANI，即0.7 wt%，PEI薄膜的介电常数和储能密度都能得到显著提高，而介电损耗仍与纯PEI一样低。实现了9.4 J/cm³的最大能量密度。为了证明质子化TANI的有效性，还制备了聚苯胺和去质子化TANI，并将其用作PEI中的掺杂剂。聚苯胺填料也能提高介电常数，但介电损耗也会增加。掺杂在PEI中的去质子化TANI对介电常数和能量密度均无影响,这意味着TANI分子的质子化氨基是PEI/TANI复合材料介电常数提高的原因。详细讨论了TANI掺杂剂的质子化与介电性能之间的相关性。
