Heck Katrin, Werner Nils, Hoffmann Lea, Schwendicke Falk, Litzenburger Friederike
Department of Conservative Dentistry and Periodontology, LMU University Hospital, LMU Munich, 80336 Munich, Germany.
Department of Orthodontics and Dentofacial Orthopedics, LMU University Hospital, LMU Munich, 80336 Munich, Germany.
Dentomaxillofac Radiol. 2025 Jan 1;54(1):70-76. doi: 10.1093/dmfr/twae049.
This in vitro study evaluated the diagnostic potential of short-wave infrared reflection (SWIRR) at 1050 and 1550 nm for proximal caries detection from the occlusal, buccal, and lingual surfaces of posterior teeth under clinically relevant conditions. Bitewing radiography (BWR) was the alternative index test and micro-computed tomography (μCT) was the reference standard.
Two hundred and fifty proximal surfaces of extracted human teeth were examined using SWIRR at 1050 and 1550 nm and BWR. SWIRR, BWR, and μCT findings were evaluated twice by 2 trained examiners. SWIRR images were evaluated from occlusal and trilateral (occlusal, buccal, and lingual combined) views. Sensitivity, specificity, and area under the curves were calculated. Reliability assessment was performed using κ statistics.
Short-wave infrared reflection (1050 nm) showed sensitivity of 0.44 for occlusal and 0.55 for trilateral assessment, paired with specificity of 0.96 and 0.90, whereas SWIRR (1550 nm) showed sensitivity of 0.73 and 0.85 paired with specificity of 0.76 and 0.59. Compared to occlusal view, trilateral SWIRR view revealed ≈10% higher sensitivity and lower specificity. BWR revealed lowest sensitivity (0.30) and highest specificity (0.99). Over- and underestimation of caries demonstrated opposite trends: from 1050 to 1550 nm, overestimation of trilateral SWIRR increased (0.08-0.29), while underestimation decreased (0.15-0.06).
Trilateral SWIRR has higher sensitivity and lower specificity for proximal caries, than occlusal SWIRR. For trilateral SWIRR, wavelengths around 1050 nm are more suitable, while 1550 nm is better for occlusal examinations. A combination of SWIRR at 1050 and 1550 nm may exhibit a balanced sensitivity and specificity for proximal caries.
本体外研究评估了在临床相关条件下，1050纳米和1550纳米的短波红外反射（SWIRR）对后牙咬合面、颊面和舌面近端龋检测的诊断潜力。咬合翼片（BWR）为替代指标检测方法，微计算机断层扫描（μCT）为参考标准。
使用1050纳米和1550纳米的SWIRR以及BWR对250个拔除的人类牙齿近端表面进行检查。SWIRR、BWR和μCT的结果由2名经过培训的检查人员评估两次。从咬合面和三边（咬合面、颊面和舌面组合）视图评估SWIRR图像。计算敏感性、特异性和曲线下面积。使用κ统计量进行可靠性评估。
短波红外反射（1050纳米）在咬合面评估时敏感性为0.44，三边评估时为0.55，特异性分别为0.96和0.90，而SWIRR（1550纳米）的敏感性为0.73和0.85，特异性为0.76和0.59。与咬合面视图相比，三边SWIRR视图显示敏感性高约10%，特异性低。BWR显示敏感性最低（0.30），特异性最高（0.99）。龋病的高估和低估呈现相反趋势：从1050纳米到1550纳米，三边SWIRR的高估增加（0.08 - 0.29），而低估减少（0.15 - 0.06）。
三边SWIRR对近端龋的敏感性高于咬合面SWIRR，特异性低于咬合面SWIRR。对于三边SWIRR，1050纳米左右的波长更合适，而1550纳米更适合咬合面检查。1050纳米和1550纳米的SWIRR组合可能对近端龋表现出平衡的敏感性和特异性。
