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用于柔性电阻式随机存取存储器阵列的可靠且稳健的二维钙钛矿忆阻器

Reliable and Robust Two-Dimensional Perovskite Memristors for Flexible-Resistive Random-Access Memory Array.

作者信息

Kim Seung Ju, Im In Hyuk, Baek Ji Hyun, Park Sung Hyuk, Kim Jae Young, Yang J Joshua, Jang Ho Won

机构信息

Department of Materials Science and Engineering, Research Institute of Advanced Materials, Seoul National University, Seoul 08826, Republic of Korea.

Ming Hsieh Department of Electrical and Computer Engineering, University of Southern California, Los Angeles, California 90089, United States.

出版信息

ACS Nano. 2024 Oct 15;18(41):28131-28141. doi: 10.1021/acsnano.4c07673. Epub 2024 Oct 3.

Abstract

Two-dimensional (2D) halide perovskites have become a promising class of memristive materials due to their low power consumption, compositional versatility, and microstructural anisotropy in electronics. However, implementing high-performance resistive random-access memory requires a higher reliability and moisture resistance. To address these issues, component studies and attempts to improve the phase stability have been reported but have not been able to achieve sufficient reliability. Here, highly textured thin films grown perpendicular to the substrate in Ruddlesden-Popper 2D perovskites exhibited highly stable and reliable binary memory performance. We further built a flexible crossbar array to verify data storage capability, achieving a high device yield, robust endurance, long retention, reliability to operate under bending conditions, and moisture stability over a year. These device performances are attributed to preformed vertically oriented nanocrystals that allow the conductive filaments to operate reliably. Our finding provides the material design strategy that can be extended to the development of semiconductor materials for next-generation memory devices.

摘要

二维(2D)卤化物钙钛矿因其低功耗、成分多样性以及在电子学中的微观结构各向异性,已成为一类很有前景的忆阻材料。然而,实现高性能电阻式随机存取存储器需要更高的可靠性和防潮性。为了解决这些问题,已有关于组件研究以及提高相稳定性的尝试的报道,但尚未能够实现足够的可靠性。在此,在Ruddlesden-Popper二维钙钛矿中垂直于衬底生长的高度织构化薄膜展现出高度稳定且可靠的二元存储性能。我们进一步构建了一个柔性交叉阵列以验证数据存储能力,实现了高器件成品率、强大的耐久性、长保持性、在弯曲条件下操作的可靠性以及超过一年的防潮稳定性。这些器件性能归因于预先形成的垂直取向纳米晶体,其使导电细丝能够可靠运行。我们的发现提供了一种材料设计策略,该策略可扩展至下一代存储器件的半导体材料开发。

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