微弧氧化对阳极氧化铝微观结构和介电性能的影响。

Influence of micro-arc oxidation on the microstructure and dielectric properties of anodic aluminum oxide.

作者信息

Qin Liyang, Fu Zhongyou, Liu Lin, Han Xiuhao, Ma Juanjuan, Li Bowen, Zhu Xufei

机构信息

Key Laboratory of Soft Chemistry and Functional Materials of Education Ministry, Nanjing University of Science and Technology, Nanjing, 210094, China.

School of Environmental and Chemical Engineering, Jiangsu Ocean University, Lianyungang, 222005, China.

出版信息

Sci Rep. 2024 Oct 10;14(1):23673. doi: 10.1038/s41598-024-74827-1.

DOI:10.1038/s41598-024-74827-1

PMID:39390077

原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC11466970/

Abstract

To improve the dielectric performance of the anodic alumina film used in aluminum electrolytic capacitors, this study comparatively investigated the microstructure and dielectric properties of anodic aluminum oxide obtained through micro-arc oxidation (MAO) and conventional anodic oxidation (CAO). It is found that from the perspective of microstructure, the internal structure of the MAO treated oxide film has more and larger pores than that of CAO. This was attributed to the generation and overflow of numerous oxygen bubbles from within the oxide film at the locations where plasma sparks occurred during the process, thus forming larger pores. Regarding dielectric properties, the leakage current of the oxide film after MAO treatment was significantly reduced compared to CAO, with reductions of 58%, 56%, 64%, and 74% for the tested electrolytes Y1-Y4, respectively.

摘要

为提高铝电解电容器中使用的阳极氧化铝薄膜的介电性能，本研究对比研究了通过微弧氧化（MAO）和传统阳极氧化（CAO）获得的阳极氧化铝的微观结构和介电性能。研究发现，从微观结构角度来看，微弧氧化处理的氧化膜内部结构比传统阳极氧化的氧化膜具有更多、更大的孔隙。这归因于在该过程中发生等离子体火花的位置处，氧化膜内部有大量氧气气泡产生并溢出，从而形成更大的孔隙。关于介电性能，微弧氧化处理后的氧化膜的漏电流与传统阳极氧化相比显著降低，对于测试电解质Y1 - Y4，分别降低了58%、56%、64%和74%。