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定制PBE交换关联泛函:一种用于多种半导体带隙预测的综合方法。

Customizing PBE exchange-correlation functionals: a comprehensive approach for band gap prediction in diverse semiconductors.

作者信息

Bhattacharjee Satadeep, Koshi Namitha Anna, Lee Seung-Cheol

机构信息

Indo-Korea Science and Technology Center (IKST), Bengaluru 560064, India.

Electronic Materials Research Center, Korea Institute of Science and Technology (KIST), Seoul 136-791, South Korea.

出版信息

Phys Chem Chem Phys. 2024 Oct 23;26(41):26443-26452. doi: 10.1039/d4cp03260h.

Abstract

Accurate band gap prediction in semiconductors is crucial for materials science and semiconductor technology advancements. This paper extends the Perdew-Burke-Ernzerhof (PBE) functional for a wide range of semiconductors, tackling the exchange and correlation enhancement factor complexities within density functional theory (DFT). Our customized functionals offer a clearer and more realistic alternative to DFT+ methods, which demand large negative values for elements like sulfur (S), selenium (Se), and phosphorus (P). Moreover, these functionals are more cost-effective than GW or Heyd-Scuseria-Ernzerhof (HSE) hybrid functional methods, therefore, significantly facilitating the way for unified workflows in analyzing electronic structure, dielectric constants, effective masses, and further transport and elastic properties, allowing for seamless calculations across various properties. We point out that such development could be helpful in the creation of comprehensive databases of band gap and dielectric properties of the materials without expensive calculations. Furthermore, for the semiconductors studied, we show that these customized functionals and the strongly constrained and appropriately normed semilocal density functional (SCAN) perform similarly in terms of the band gap.

摘要

准确预测半导体中的带隙对于材料科学和半导体技术的进步至关重要。本文将Perdew-Burke-Ernzerhof(PBE)泛函扩展到多种半导体,解决了密度泛函理论(DFT)中交换和关联增强因子的复杂性问题。我们定制的泛函为DFT+方法提供了一种更清晰、更现实的替代方案,DFT+方法要求硫(S)、硒(Se)和磷(P)等元素具有较大的负值。此外,这些泛函比GW或Heyd-Scuseria-Ernzerhof(HSE)杂化泛函方法更具成本效益,因此,显著促进了分析电子结构、介电常数、有效质量以及进一步的输运和弹性性质的统一工作流程,允许对各种性质进行无缝计算。我们指出,这样的发展有助于在不进行昂贵计算的情况下创建材料带隙和介电性质的综合数据库。此外,对于所研究的半导体,我们表明这些定制的泛函与强约束适当归一化半局域密度泛函(SCAN)在带隙方面表现相似。

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