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扫描透射电子断层扫描术用于研究病毒组装:保罗·瓦尔特退休纪念综述

Scanning transmission electron tomography to study virus assembly: Review for the retirement of Paul Walther.

作者信息

Wieczorek Susanne, Krijnse Locker Jacomina

机构信息

Department of Microscopy of Pathogens, Paul Ehrlich Institute, Langen, Germany.

出版信息

J Microsc. 2025 Sep;299(3):206-211. doi: 10.1111/jmi.13374. Epub 2024 Nov 26.

Abstract

In this short and popular review, we summarise some of our findings analysing the replication cycles of large DNA viruses using scanning transmission electron tomography (STEM tomography) that we applied in the laboratory of Paul Walther. It is also a tribute to a very kind and expert scientist, who recently retired. Transmission electron microscopy (TEM), in particular cryo-EM, has benefited tremendously from recent developments in instrumentation. However, TEM imaging remains limited by the thickness of the specimen and classical thin-section TEM typically generates 2D representations of 3D volumes. Although TEM tomography can partly overcome this limitation, the thickness of the sample, the volume that can be analysed in 3D, remains limiting. STEM tomography can partly overcome this problem, as it allows for the analysis of thicker samples, up to 1 µm in thickness. As such, it is an interesting imaging technique to analyse large DNA viruses, some of which measure 1 µm or more, and which is the focus of our research interest.

摘要

在这篇简短且广受欢迎的综述中,我们总结了一些研究发现,这些发现来自于我们在保罗·瓦尔特实验室运用扫描透射电子断层扫描术(STEM断层扫描)对大型DNA病毒复制周期的分析。这也是对一位非常和蔼且专业的科学家的致敬,他最近退休了。透射电子显微镜(TEM),尤其是冷冻电镜,极大地受益于仪器设备的最新发展。然而,TEM成像仍然受限于样品的厚度,传统的超薄切片TEM通常生成三维体积的二维图像。尽管TEM断层扫描可以部分克服这一局限性,但样品的厚度,即能够进行三维分析的体积,仍然具有局限性。STEM断层扫描可以部分克服这个问题,因为它允许分析更厚的样品,厚度可达1微米。因此,它是一种用于分析大型DNA病毒的有趣成像技术,其中一些病毒的大小为1微米或更大,这也是我们研究兴趣的焦点。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/5822/12352017/d95d6ace4c1f/JMI-299-206-g003.jpg

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