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用单层 WSe 对六方氮化硼中滑动铁电开关进行光学检测。

Optical Detection of Sliding Ferroelectric Switching in hBN with a WSe Monolayer.

作者信息

Roux Sébastien, Fraunié Jules, Watanabe Kenji, Taniguchi Takashi, Lassagne Benjamin, Robert Cedric

机构信息

Université de Toulouse, INSA-CNRS-UPS, LPCNO, 135 Av. Rangueil, 31077 Toulouse, France.

Research Center for Electronic and Optical Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan.

出版信息

Nano Lett. 2025 Jan 8;25(1):321-326. doi: 10.1021/acs.nanolett.4c05062. Epub 2024 Dec 17.

Abstract

When two BN layers are stacked in parallel in an AB or BA arrangement, a spontaneous out-of-plane electric polarization arises due to charge transfer in the out-of-plane B-N bonds. The ferroelectric switching from AB to BA (or BA to AB) can be achieved with a relatively small out-of-plane electric field through the in-plane sliding of one atomic layer over the other. However, the optical detection of such ferroelectric switching in hBN has not yet been demonstrated. In this study, we utilize an adjacent WSe monolayer to detect the ferroelectric switching in BN. This dynamic coupling between a two-dimensional (2D) ferroelectric and a 2D semiconductor allows for the fundamental investigation of the ferroelectric material using a nondestructive, local optical probe, offering promising applications for compact and nonvolatile memory devices.

摘要

当两个BN层以AB或BA排列方式平行堆叠时,由于面外B-N键中的电荷转移,会产生自发的面外电极化。通过一个原子层在另一个原子层上的面内滑动,利用相对较小的面外电场就可以实现从AB到BA(或从BA到AB)的铁电切换。然而,尚未证明在hBN中能对这种铁电切换进行光学检测。在本研究中,我们利用相邻的WSe单分子层来检测BN中的铁电切换。二维(2D)铁电体与2D半导体之间的这种动态耦合,使得能够使用无损局部光学探针,对铁电材料进行基础研究,为紧凑且非易失性存储器件提供了有前景的应用。

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