Chen Ning Jung, Yeh Chia Hui, Cao Huai Yu, Chen Nai Chi, Chen Chun Jung, Chen Chun Yu, Tsai Yi Wei, Lin Jhih Min, Huang Yu Shan, Hsiao Chien Nan, Chen Chien Chun
Department of Engineering and System Science, National Tsing Hua University, Hsinchu 30013, Taiwan.
Department of Physics, National Tsing Hua University, Hsinchu 30013, Taiwan.
J Synchrotron Radiat. 2025 Jan 1;32(Pt 1):217-224. doi: 10.1107/S1600577524010567.
Coherent diffraction microscopy (CDM) is a robust direct imaging method due to its unique 2D/3D phase retrieval capacity. Nonetheless, its resolution faces limitations due to a diminished signal-to-noise ratio (SNR) in high-frequency regions. Addressing this challenge, X-ray ensemble diffraction microscopy (XEDM) emerges as a viable solution, ensuring an adequate SNR in high-frequency regions and effectively surmounting resolution constraints. In this article, two experiments were conducted to underscore XEDM's superior spatial resolution capabilities. These experiments employed 55 nm-sized silicon-gold nanoparticles (NPs) and 19 nm-sized nodavirus-like particles (NV-LPs) on the coherent X-ray scattering beamline of the Taiwan Photon Source. The core-shell density distribution of the silicon-gold NPs was successfully obtained with a radial resolution of 3.4 nm per pixel, while NV-LPs in solution were reconstructed at a radial resolution of 1.3 nm per pixel. The structural information was directly retrieved from the diffraction intensities without prior knowledge and was subsequently confirmed through transmission electron microscopy.
相干衍射显微镜（CDM）是一种强大的直接成像方法，因其独特的二维/三维相位恢复能力。尽管如此，由于高频区域的信噪比（SNR）降低，其分辨率面临限制。为应对这一挑战，X射线系综衍射显微镜（XEDM）应运而生，它能确保高频区域有足够的信噪比，并有效克服分辨率限制。在本文中，进行了两项实验以突出XEDM卓越的空间分辨率能力。这些实验在台湾光源的相干X射线散射束线上使用了55纳米大小的硅金纳米颗粒（NPs）和19纳米大小的诺达病毒样颗粒（NV-LPs）。成功获得了硅金纳米颗粒的核壳密度分布，径向分辨率为每像素3.4纳米，而溶液中的NV-LPs以每像素1.3纳米的径向分辨率进行了重建。结构信息直接从衍射强度中获取，无需先验知识，随后通过透射电子显微镜得到了证实。
