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绘制多端约瑟夫森结中拓扑邻近诱导能隙

Mapping the Topological Proximity-Induced Gap in Multiterminal Josephson Junctions.

作者信息

Wisne M, Deng Y, Lilja I M A, Hakonen P J, Chandrasekhar V

机构信息

Department of Physics and Astronomy, <a href="https://ror.org/000e0be47">Northwestern University</a>, 2145 Sheridan Road, Evanston, Illinois 60208, USA.

QTF Centre of Excellence, Department of Applied Physics, <a href="https://ror.org/020hwjq30">Aalto University</a>, Espoo, Finland.

出版信息

Phys Rev Lett. 2024 Dec 13;133(24):246601. doi: 10.1103/PhysRevLett.133.246601.

Abstract

Multiterminal Josephson junctions (MTJJs), devices in which a normal metal is in contact with three or more superconducting leads, have been proposed as artificial analogs of topological crystals. The topological nature of MTJJs manifests as a modulation of the quasiparticle density of states (DOS) in the normal metal that may be probed by tunneling measurements. We show that one can reveal this modulation by measuring the resistance of diffusive MTJJs with normal contacts, which shows rich structure as a function of the phase differences {ϕ_{i}}. Our approach demonstrates a simple yet powerful technique for exploring topological effects in MTJJs.

摘要

多端约瑟夫森结(MTJJ)是一种正常金属与三个或更多超导引线相接触的器件,已被提议作为拓扑晶体的人工类似物。MTJJ的拓扑性质表现为正常金属中准粒子态密度(DOS)的调制,这可以通过隧穿测量来探测。我们表明,通过测量具有正常接触的扩散型MTJJ的电阻,可以揭示这种调制,该电阻作为相位差{ϕ_{i}}的函数呈现出丰富的结构。我们的方法展示了一种用于探索MTJJ中拓扑效应的简单而强大的技术。

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