Jeong Beomgyun, Abbas Hafiz Ghulam, Klein Benedikt P, Bae Geunsu, Velmurugan Adith Ramakrishnan, Choi Chang Hyuck, Kim Geonhwa, Kim Dongwoo, Kim Ki-Jeong, Cha Byeong Jun, Kim Young Dok, Jaouen Frédéric, Maurer Reinhard J, Ringe Stefan
Korea Basic Science Institute, Daejeon, 34133, Korea.
Department of Chemistry, Korea University, Seoul, 02841, Korea.
Angew Chem Int Ed Engl. 2025 Mar 3;64(10):e202420673. doi: 10.1002/anie.202420673. Epub 2025 Feb 10.
Quantifying the number of active sites is a crucial aspect in the performance evaluation of single metal-atom electrocatalysts. A possible realization is using adsorbing gas molecules that selectively bind to the single-atom transition metal and then probing their surface density using spectroscopic tools. Herein, using in situ X-ray photoelectron spectroscopy (XPS) and near edge X-ray absorption fine structure (NEXAFS) spectroscopy, we detect adsorbed CO gas molecules on a FeNC oxygen reduction single atom catalyst. Correlating XPS and NEXAFS, we develop a simple surface- and chemically-sensitive protocol to accurately and quickly quantify the active site density. Density functional theory-based X-ray spectra simulations reaffirm the assignment of the spectroscopic fingerprints of the CO molecules adsorbed at Fe-N-C sites, and provide additional unexpected structural insights about the active site needed to explain the low-temperature CO adsorption. Our work represents an important step towards an accurate quantitative catalytic performance evaluation, and thus towards developing reliable material design principles and catalysts.
量化活性位点的数量是单金属原子电催化剂性能评估的关键环节。一种可行的方法是使用吸附性气体分子,这些分子能选择性地与单原子过渡金属结合,然后利用光谱工具探测其表面密度。在此,我们通过原位X射线光电子能谱(XPS)和近边X射线吸收精细结构(NEXAFS)光谱,检测到FeNC氧还原单原子催化剂上吸附的CO气体分子。通过关联XPS和NEXAFS,我们开发了一种简单的、对表面和化学敏感的方法,以准确快速地量化活性位点密度。基于密度泛函理论的X射线光谱模拟再次证实了吸附在Fe-N-C位点的CO分子光谱指纹的归属,并提供了有关活性位点的额外意外结构见解,以解释低温CO吸附现象。我们的工作是迈向准确量化催化性能评估的重要一步,从而有助于制定可靠的材料设计原则和开发催化剂。