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基于深度学习增强型表面等离子体显微镜的功能性纳米颗粒精确尺寸测定与碰撞检测

Precise Sizing and Collision Detection of Functional Nanoparticles by Deep Learning Empowered Plasmonic Microscopy.

作者信息

Wang Jingan, Sun Yi, Yang Yuting, Zhang Cheng, Zheng Weiqiang, Wang Chen, Zhang Wei, Zhou Lianqun, Yu Hui, Li Jinghong

机构信息

School of Biomedical Engineering, Shanghai Jiao Tong University, Shanghai, 200030, China.

Department of Chemistry, Center for BioAnalytical Chemistry, Key Laboratory of Bioorganic Phosphorus Chemistry and Chemical Biology, Tsinghua University, Beijing, 100084, China.

出版信息

Adv Sci (Weinh). 2025 Mar;12(9):e2407432. doi: 10.1002/advs.202407432. Epub 2025 Jan 10.

Abstract

Single nanoparticle analysis is crucial for various applications in biology, materials, and energy. However, precisely profiling and monitoring weakly scattering nanoparticles remains challenging. Here, it is demonstrated that deep learning-empowered plasmonic microscopy (Deep-SM) enables precise sizing and collision detection of functional chemical and biological nanoparticles. Image sequences are recorded by the state-of-the-art plasmonic microscopy during single nanoparticle collision onto the sensor surface. Deep-SM can enhance signal detection and suppresses noise by leveraging spatio-temporal correlations of the unique signal and noise characteristics in plasmonic microscopy image sequences. Deep-SM can provide significant scattering signal enhancement and noise reduction in dynamic imaging of biological nanoparticles as small as 10 nm, as well as the collision detection of metallic nanoparticle electrochemistry and quantum coupling with plasmonic microscopy. The high sensitivity and simplicity make this approach promising for routine use in nanoparticle analysis across diverse scientific fields.

摘要

单纳米颗粒分析对于生物学、材料科学和能源领域的各种应用至关重要。然而,精确分析和监测弱散射纳米颗粒仍然具有挑战性。在此,研究表明深度学习赋能的表面等离子体显微镜(Deep-SM)能够对功能性化学和生物纳米颗粒进行精确尺寸测量和碰撞检测。在单个纳米颗粒碰撞到传感器表面的过程中,通过最先进的表面等离子体显微镜记录图像序列。Deep-SM可以利用表面等离子体显微镜图像序列中独特信号和噪声特征的时空相关性来增强信号检测并抑制噪声。在对小至10纳米的生物纳米颗粒进行动态成像时,Deep-SM能够显著增强散射信号并降低噪声,还能通过表面等离子体显微镜实现金属纳米颗粒电化学和量子耦合的碰撞检测。这种方法的高灵敏度和简便性使其有望在不同科学领域的纳米颗粒分析中常规使用。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/23b2/11884610/bec0eefa0f9f/ADVS-12-2407432-g001.jpg

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