Dual-Beam THz Spectrometer with Low-Aberration Optics and Off-Axis Multipixel Photoconductive Emitters for Reduced Systematic Errors.

A dual-beam THz spectrometer is reported that substantially reduces the influence of systematic errors in THz time-domain spectroscopy such as those caused by variations in femtosecond laser power or the environmental temperature and humidity. Dual THz beams with single-cycle waveforms were generated simultaneously using a dual-pixel interdigitated photoconductive antenna, allowing the simultaneous acquisition of sample and reference data in the spectrometer using the same optical components. A low-aberration optical geometry ensured diffraction-limited spatial profiles for both beams despite their off-axis propagation and was validated experimentally by measuring frequency-dependent beam profiles and theoretically via physical optics calculations. Although the experimental amplitudes and absolute phase spectra of both beams were very similar, we further provided a correction procedure to eliminate these small differences. The robustness of the dual-beam spectrometer design was evaluated by measuring the complex transmission of a thin plastic sheet after intentionally introducing a change in the relative humidity of the THz beam path. The dual-beam THz spectrometer was effective at removing systematic errors in the amplitude and phase by simultaneously measuring the two THz beams under the same conditions.