Editorial to "Can lead damage be ruled out using defibrillation threshold testing in patients with very high-impedance shock leads?": Beyond the numbers: Reconsidering high shock impedance in ICD leads with DFT testing.
作者信息
Enomoto Yoshinari
机构信息
Department of Cardiology Center Hospital of the National Center for Global Health and Medicine Tokyo Japan.
出版信息
J Arrhythm. 2025 Mar 4;41(2):e70032. doi: 10.1002/joa3.70032. eCollection 2025 Apr.
Abstract
摘要
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Editorial to "Can lead damage be ruled out using defibrillation threshold testing in patients with very high-impedance shock leads?": Beyond the numbers: Reconsidering high shock impedance in ICD leads with DFT testing.《“对于高阻抗休克导线患者，能否通过除颤阈值测试排除铅损伤？”的社论》：超越数字：通过DFT测试重新审视植入式心律转复除颤器导线中的高休克阻抗
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本文引用的文献
1
Can lead damage be ruled out using defibrillation threshold testing in patients with very high-impedance shock leads?对于具有非常高阻抗休克导联的患者，能否通过除颤阈值测试排除导联损伤？
J Arrhythm. 2025 Feb 12;41(1):e70014. doi: 10.1002/joa3.70014. eCollection 2025 Feb.
2
Rate and predictors of electrical failure in non-recalled defibrillator leads.未召回的除颤器导线电气故障的发生率及预测因素。
Indian Pacing Electrophysiol J. 2019 May-Jun;19(3):100-103. doi: 10.1016/j.ipej.2018.12.001. Epub 2018 Dec 18.
3
Class I recall of defibrillator leads: a comparison of the Sprint Fidelis and Riata families.I 类除颤器导线召回：Sprint Fidelis 和 Riata 家族的比较。
Heart Rhythm. 2012 Aug;9(8):1251-5. doi: 10.1016/j.hrthm.2012.04.003. Epub 2012 Apr 3.
4
Annual rate of transvenous defibrillation lead defects in implantable cardioverter-defibrillators over a period of >10 years.超过10年期间植入式心脏复律除颤器经静脉除颤导线缺陷的年发生率。
Circulation. 2007 May 15;115(19):2474-80. doi: 10.1161/CIRCULATIONAHA.106.663807. Epub 2007 Apr 30.
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