Checri R, Baldassari S, Baulac S
Institut du Cerveau-Paris Brain Institute-ICM, Sorbonne Université, Inserm, CNRS, Hôpital de la Pitié-Salpêtrière, 75013 Paris, France; Pediatric Neurosurgery Department, CCMR Epilepsies Rares, European Reference Network EpiCare Member, Rothschild Hospital Foundation, 75019 Paris, France.
Institut du Cerveau-Paris Brain Institute-ICM, Sorbonne Université, Inserm, CNRS, Hôpital de la Pitié-Salpêtrière, 75013 Paris, France.
Rev Neurol (Paris). 2025 May;181(5):425-431. doi: 10.1016/j.neurol.2025.03.003. Epub 2025 Apr 4.
Brain somatic mutations are increasingly recognized as major drivers of focal epilepsy particularly in malformations of cortical development. While traditionally relying on surgically resected tissue for genetic analysis, recent advances in molecular techniques now enable the recovery and analysis of DNA from stereo-electroencephalography (SEEG) electrodes. This minimally invasive approach provides unprecedented opportunities to identify somatic mutations in patients who may not undergo resective surgery. Here, we review the current state of molecular analyses from SEEG electrodes, including recent developments in DNA sequencing, transcriptomics, and epigenetic profiling. We discuss how genetic testing may be integrated into presurgical evaluations, providing new opportunities for comprehensive molecular phenotyping of focal epilepsies. These innovations hold promises in enhancing surgical outcome prediction and guiding toward targeted therapies.
脑体细胞突变越来越被认为是局灶性癫痫的主要驱动因素,尤其是在皮质发育畸形中。传统上依靠手术切除的组织进行基因分析,而分子技术的最新进展现在能够从立体脑电图(SEEG)电极中回收和分析DNA。这种微创方法为识别可能无法接受切除手术的患者的体细胞突变提供了前所未有的机会。在这里,我们回顾了来自SEEG电极的分子分析的现状,包括DNA测序、转录组学和表观遗传谱分析的最新进展。我们讨论了基因检测如何融入术前评估,为局灶性癫痫的全面分子表型分析提供新机会。这些创新有望提高手术结果预测能力并导向靶向治疗。