用于纳米材料合成与表征的聚焦离子束和电子束 - Suppr

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超能文献

Focused ion and electron beams for synthesis and characterization of nanomaterials.

作者信息

Szkudlarek Aleksandra

机构信息

Academic Centre for Materials and Nanotechnology, AGH University of Krakow, av. Mickiewicza 30, 30-059, Krakow, Poland.

出版信息

Beilstein J Nanotechnol. 2025 May 2;16:613-616. doi: 10.3762/bjnano.16.47. eCollection 2025.

DOI:10.3762/bjnano.16.47

PMID:40331059

原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC12051457/

Abstract

摘要

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8195/12051457/175e5eba4cf5/Beilstein_J_Nanotechnol-16-613-g001.jpg

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本文引用的文献

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A low-kiloelectronvolt focused ion beam strategy for processing low-thermal-conductance materials with nanoampere currents.

Beilstein J Nanotechnol. 2024 Sep 27;15:1197-1207. doi: 10.3762/bjnano.15.97. eCollection 2024.

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Beilstein J Nanotechnol. 2024 Aug 26;15:1117-1124. doi: 10.3762/bjnano.15.90. eCollection 2024.

Water-assisted purification during electron beam-induced deposition of platinum and gold.

Beilstein J Nanotechnol. 2024 Jul 18;15:884-896. doi: 10.3762/bjnano.15.73. eCollection 2024.

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Beilstein J Nanotechnol. 2024 Jul 3;15:797-807. doi: 10.3762/bjnano.15.66. eCollection 2024.

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Beilstein J Nanotechnol. 2024 May 8;15:500-516. doi: 10.3762/bjnano.15.45. eCollection 2024.

Sidewall angle tuning in focused electron beam-induced processing.

Beilstein J Nanotechnol. 2024 Apr 23;15:447-456. doi: 10.3762/bjnano.15.40. eCollection 2024.

Ion beam processing of DNA origami nanostructures.

Beilstein J Nanotechnol. 2024 Feb 12;15:207-214. doi: 10.3762/bjnano.15.20. eCollection 2024.

Graphene removal by water-assisted focused electron-beam-induced etching - unveiling the dose and dwell time impact on the etch profile and topographical changes in SiO substrates.

Beilstein J Nanotechnol. 2024 Feb 7;15:190-198. doi: 10.3762/bjnano.15.18. eCollection 2024.