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单晶CMSX-4高温合金中缺陷结构的多尺度分析

Multiscale Analysis of Defect Structures in Single-Crystalline CMSX-4 Superalloys.

作者信息

Paszkowski Robert, Kołodziej Sławomir, Pawlyta Mirosława, Chrząszcz Beata

机构信息

Institute of Materials Engineering, University of Silesia in Katowice, 1A 75 Pułku Piechoty St., 41-500 Chorzów, Poland.

Materials Research Laboratory, Faculty of Mechanical Engineering, Silesian University of Technology, Konarskiego 18 A, 44-100 Gliwice, Poland.

出版信息

Materials (Basel). 2025 Apr 16;18(8):1819. doi: 10.3390/ma18081819.

Abstract

An analysis of defects creation in the vicinity of the selector-root connection plane in single-crystalline turbine blades made of CMSX-4 Ni-base superalloy was performed using several experimental methods. A coupling of scanning electron microscopy and X-ray diffraction topography allowed the visualization of dendritic arrays and surface defects in the root part of the blades. As a result, contrast inversions and areas where internal stresses occur were observed. The defects on a microscopic scale were characterized using positron annihilation lifetime spectroscopy and transmission electron microscopy. The registered positron lifetimes, above 0.5 ns, beyond the range characteristic for defects generally reported in metals and their alloys suggest the presence extremely large void type defects. Herein, we have identified large defects, ca. 2-5 nm in diameter, formed due to the contraction of fluid metal, captured in inter-dendritic regions during the liquid-to-solid transition. This work is a precursor to the almost untouched area of the discussion of lifetimes characteristic for positron bound states, called positronium (>0.5 ns) in relation to the morphology of void-type defects in single-crystalline superalloys.

摘要

采用多种实验方法对由CMSX-4镍基高温合金制成的单晶涡轮叶片中选粉器-根部连接平面附近的缺陷产生情况进行了分析。扫描电子显微镜与X射线衍射形貌术相结合,使得叶片根部的枝晶阵列和表面缺陷得以可视化。结果,观察到了对比度反转和出现内应力的区域。利用正电子湮没寿命谱和透射电子显微镜对微观尺度的缺陷进行了表征。记录到的正电子寿命超过0.5 ns,超出了金属及其合金中通常报道的缺陷特征范围,这表明存在极大的空洞型缺陷。在此,我们已经识别出由于液态金属收缩而形成的大缺陷,其直径约为2至5纳米,在液固转变过程中被捕获在枝晶间区域。这项工作是关于正电子束缚态(称为正电子素,寿命>0.5 ns)寿命特征与单晶高温合金中空洞型缺陷形态关系这一几乎未被触及领域讨论的先驱。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/65a7/12029085/077da4b587b8/materials-18-01819-g0A1.jpg

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