Consolati Giovanni, Nichetti Dario, Quasso Fiorenza
Department of Aerospace Science and Technology, Politecnico di Milano, Via LaMasa, 34, 20156 Milano, Italy.
INFN, Sezione di Milano, Via Celoria, 16, 20133 Milano, Italy.
Polymers (Basel). 2023 Jul 23;15(14):3128. doi: 10.3390/polym15143128.
Positron annihilation lifetime spectroscopy (PALS) is a valuable technique to investigate defects in solids, such as vacancy clusters and grain boundaries in metals and alloys, as well as lattice imperfections in semiconductors. Positron spectroscopy is able to reveal the size, structure and concentration of vacancies with a sensitivity of 10. In the field of porous and amorphous systems, PALS can probe cavities in the range from a few tenths up to several tens of nm. In the case of polymers, PALS is one of the few techniques able to give information on the holes forming the free volume. This quantity, which cannot be measured with macroscopic techniques, is correlated to important mechanical, thermal, and transport properties of polymers. It can be deduced theoretically by applying suitable equations of state derived by cell models, and PALS supplies a quantitative measure of the free volume by probing the corresponding sub-nanometric holes. The system used is positronium (Ps), an unstable atom formed by a positron and an electron, whose lifetime can be related to the typical size of the holes. When analyzed in terms of continuous lifetimes, the positron annihilation spectrum allows one to gain insight into the distribution of the free volume holes, an almost unique feature of this technique. The present paper is an overview of PALS, addressed in particular to readers not familiar with this technique, with emphasis on the experimental aspects. After a general introduction on free volume, positronium, and the experimental apparatus needed to acquire the corresponding lifetime, some of the recent results obtained by various groups will be shown, highlighting the connections between the free volume as probed by PALS and structural properties of the investigated materials.
正电子湮没寿命谱(PALS)是一种用于研究固体缺陷的重要技术,例如金属和合金中的空位团簇和晶界,以及半导体中的晶格缺陷。正电子谱能够以10的灵敏度揭示空位的大小、结构和浓度。在多孔和非晶体系领域,PALS可以探测从十分之几到几十纳米范围内的空洞。对于聚合物而言,PALS是少数能够提供有关构成自由体积的孔洞信息的技术之一。这个无法用宏观技术测量的量,与聚合物的重要力学、热学和传输性质相关。它可以通过应用由晶格模型推导的合适状态方程从理论上推导出来,并且PALS通过探测相应的亚纳米孔洞提供自由体积的定量测量。所使用的体系是正电子素(Ps),一种由一个正电子和一个电子形成的不稳定原子,其寿命与孔洞的典型尺寸有关。当根据连续寿命进行分析时,正电子湮没谱能够让人深入了解自由体积孔洞的分布,这是该技术几乎独一无二的特征。本文是对PALS的概述,特别针对不熟悉该技术的读者,重点在于实验方面。在对自由体积、正电子素以及获取相应寿命所需的实验装置进行一般性介绍之后,将展示各个研究小组最近获得的一些结果,突出PALS探测的自由体积与所研究材料结构性质之间的联系。