Aulika Ilze, Paulsone Patricija, Oras Sven, Butikova Jelena, Zommere Margarita Anna, Laizane Elina, Vembris Aivars
Institute of Solid State Physics, University of Latvia, Kengaraga iela 8, LV-1063 Riga, Latvia.
Institute of Technology, University of Tartu, Nooruse 1, 50411 Tartu, Estonia.
Materials (Basel). 2025 May 13;18(10):2261. doi: 10.3390/ma18102261.
The thermal behavior of a three-layer structure-glass/ITO/TAPC/CBP/BPhen-in an OLED system was investigated using in situ spectroscopic ellipsometry during controlled heating from room temperature to 120 °C over 60 min, simulating the ageing process and analyzing degradation kinetics. Variations in Ψ and Δ spectra were observed across the entire 0.7-5.9 eV spectral range, with five distinct anomalies, particularly in the UV region. An anomaly at approximately 66 °C was attributed to the glass transition temperature of BPhen, while another two at around 82 °C and at around 112 °C corresponded to the first-order phase transition of TAPC and of CBP, respectively. The origins of the remaining anomalies at 91 °C and 112 °C were explored in this study, with a focus on interphase layer formation and morphological changes that emerge during heating. These findings provide insights into the stability of OLEDs under thermal stress.
在一个OLED系统中,使用原位光谱椭偏仪研究了三层结构玻璃/ITO/TAPC/CBP/BPhen在从室温到120°C的60分钟受控加热过程中的热行为,模拟老化过程并分析降解动力学。在整个0.7 - 5.9 eV光谱范围内观察到Ψ和Δ光谱的变化,有五个明显的异常,特别是在紫外区域。大约66°C处的异常归因于BPhen的玻璃化转变温度,而另外两个分别在82°C左右和112°C左右的异常分别对应于TAPC和CBP的一级相变。本研究探讨了91°C和112°C处其余异常的起源,重点关注加热过程中出现的界面层形成和形态变化。这些发现为OLED在热应力下的稳定性提供了见解。