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利用纳米套装相关光电子显微镜扩展石蜡切片研究的潜力。

Expanding the potential of paraffin section studies using NanoSuit-correlative light and electron microscopy.

作者信息

Kawasaki Hideya

机构信息

NanoSuit Research Laboratory, Division of Preeminent Bioimaging Research, Institute of Photonics Medicine, Hamamatsu University School of Medicine, 1-20-1 Handayama, Chuo-ku, Hamamatsu, 431-3192, Japan.

出版信息

Microscopy (Oxf). 2025 May 29. doi: 10.1093/jmicro/dfaf028.

Abstract

Histological examination using optical microscopy is essential in life sciences and diagnostic medicine, particularly for formalin-fixed paraffin-embedded (FFPE) tissue sections stained with hematoxylin and eosin or 3,3'-diaminobenzidine. However, conventional electron microscopy faces challenges, such as sample destruction, complex processing, and difficulty in correlating light and electron microscopy images. The NanoSuit method overcomes these limitations by forming an ultrathin protective membrane that enhances conductivity and preserves hydrated tissue architecture, enabling high-resolution scanning electron microscopy imaging. In this study, we applied NanoSuit-correlative light and electron microscopy (CLEM) to FFPE sections to assess its potential for non-destructive and reversible electron microscopy characterization. Using NanoSuit-CLEM, we successfully visualized endothelial structures, amyloid deposits, sarcomeres, mitochondria, bacteria, viruses, and foreign body deposits in FFPE sections. Energy-dispersive X-ray spectrometry further facilitated elemental analysis of foreign materials. These findings demonstrate that NanoSuit-CLEM allows for the precise visualization of ultrastructural details in FFPE sections without requiring new equipment. This method holds promise for advancing pathology by improving diagnostic accuracy and enabling multimodal tissue analysis.

摘要

在生命科学和诊断医学中,使用光学显微镜进行组织学检查至关重要,特别是对于用苏木精和伊红或3,3'-二氨基联苯胺染色的福尔马林固定石蜡包埋(FFPE)组织切片。然而,传统电子显微镜面临着诸如样品破坏、处理复杂以及难以关联光学和电子显微镜图像等挑战。NanoSuit方法通过形成超薄保护膜来克服这些限制,该保护膜可增强导电性并保留水合组织结构,从而实现高分辨率扫描电子显微镜成像。在本研究中,我们将NanoSuit相关光电子显微镜(CLEM)应用于FFPE切片,以评估其在无损和可逆电子显微镜表征方面的潜力。使用NanoSuit-CLEM,我们成功地在FFPE切片中可视化了内皮结构、淀粉样沉积物、肌节、线粒体、细菌、病毒和异物沉积物。能量色散X射线光谱法进一步促进了对异物的元素分析。这些发现表明,NanoSuit-CLEM无需新设备即可精确可视化FFPE切片中的超微结构细节。该方法有望通过提高诊断准确性和实现多模态组织分析来推动病理学发展。

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