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通过小角X射线散射解析微相分离二嵌段共聚物中的界面致密化

Interface densification in a microphase-separated diblock copolymer resolved by small-angle X-ray scattering.

作者信息

Lin Yu-Hsuan, Chen Yu-Chung, Sahare Aditya, Lai Yi-Cheng, Su Chun-Jen, Tsai Jing-Cherng, Yamamoto Katsuhiro, Chen Hsin-Lung

机构信息

Department of Chemical Engineering National United University Miaoli360302 Taiwan.

Department of Chemical Engineering National Tsing Hua University Hsinchu300044 Taiwan.

出版信息

J Appl Crystallogr. 2025 May 12;58(Pt 3):869-878. doi: 10.1107/S1600576725002638. eCollection 2025 Jun 1.

Abstract

In block copolymers exhibiting lower critical ordering transition behavior, the segregation strength increases with temperature due to the significantly different thermal expansivities of the constituent blocks. Using synchrotron small-angle X-ray scattering, we reveal a phenomenon of segmental densification at the microdomain interface in this type of system, where the local electron density in a specific region of the interface surpasses that of the denser domain. As a result, the interfacial electron density profile deviates significantly from the hyperbolic tangent function expected for an incompressible melt. This unique densification effect can be attributed to the negative volume of mixing at the interface between the dissimilar segments and emerges when the electron densities of the constituent blocks are similar.

摘要

在表现出较低临界有序转变行为的嵌段共聚物中,由于组成嵌段的热膨胀系数显著不同,相分离强度随温度升高而增加。利用同步加速器小角X射线散射,我们揭示了这类体系中微区界面处的链段致密化现象,即界面特定区域的局部电子密度超过了较致密区域的电子密度。结果,界面电子密度分布显著偏离了不可压缩熔体预期的双曲正切函数。这种独特的致密化效应可归因于不同链段之间界面处的混合体积为负,并且当组成嵌段的电子密度相似时出现。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e66f/12135978/9310ffe903cf/j-58-00869-fig1.jpg

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