Li Haozhe, Peng Xing, Wang Bo, Shi Feng, Xia Yu, Li Shucheng, Shan Chong, Li Shiqing
College of Intelligent Science and Technology, National University of Defense Technology, Changsha 410073, China.
National Key Laboratory of Equipment State Sensing and Smart Support, Changsha 410073, China.
Nanomaterials (Basel). 2025 May 25;15(11):795. doi: 10.3390/nano15110795.
Aiming at the key technology of defect detection in precision additive manufacturing of highly reflective metal materials, this study proposes an enhanced SCK-YOLOV5 framework, which combines polarization imaging and deep learning methods to significantly improve the intelligent identification ability of small metal micro and nano defects. This framework introduces the SNWD (Selective Network with attention for Defect and Weathering Degradation) Loss function, which combines the SIOU Angle Loss with the NWD distribution sensing characteristics. It is specially designed for automatic positioning and identification of micrometer hole defects. At the same time, we employ global space construction with a dual-attention mechanism and multi-scale feature refining technique with selection kernel convolution to extract multi-scale defect information from highly reflective surfaces stably. Combined with the polarization imaging preprocessing and the comparison of enhancement defects under high reflectivity, the experimental results show that the proposed method significantly improves the precision, recall rate, and 50 index compared with the YOLOv5 baseline (increased by 0.5%, 1.2%, and 1.8%, respectively). It is the first time that this improvement has been achieved among the existing methods based on the YOLO framework. It creates a new paradigm for intelligent defect detection in additive manufacturing of high-precision metal materials and provides more reliable technical support for quality control in industrial manufacturing.
针对高反射金属材料精密增材制造中的缺陷检测关键技术,本研究提出了一种增强型SCK - YOLOV5框架,该框架将偏振成像与深度学习方法相结合,显著提高了对金属微小和纳米缺陷的智能识别能力。此框架引入了SNWD(用于缺陷和风化退化的带注意力的选择性网络)损失函数,它将SIOU角度损失与NWD分布感知特性相结合,专门用于微米级孔洞缺陷的自动定位和识别。同时,我们采用具有双注意力机制的全局空间构建和带有选择内核卷积的多尺度特征细化技术,以从高反射表面稳定地提取多尺度缺陷信息。结合偏振成像预处理和高反射率下增强缺陷的比较,实验结果表明,与YOLOv5基线相比,该方法显著提高了精度、召回率和50指标(分别提高了0.5%、1.2%和1.8%)。在基于YOLO框架的现有方法中,首次实现了这种改进。它为高精度金属材料增材制造中的智能缺陷检测创造了新范式,为工业制造中的质量控制提供了更可靠的技术支持。