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通过原位表征揭示界面化学限制深蓝色钙钛矿发光二极管的稳定性

Interfacial Chemistry Limits the Stability of Deep Blue Perovskite LEDs Revealed by Operando Characterization.

作者信息

Mirabelli Alessandro J, Kammlander Birgit, Lu Yang, Varma Rahul Mahavir, Gu Qichun, Radetzky Karen, Selby Thomas A, Liu Tianjun, Riva Stefania, Wei Zimu, Lee Tien-Lin, Rawle Jonathan, Rensmo Håkan, Anaya Miguel, Cappel Ute B, Stranks Samuel D

机构信息

Department of Chemical Engineering and Biotechnology, University of Cambridge, Philippa Fawcett Drive, Cambridge CB3 0AS, U.K.

Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, U.K.

出版信息

ACS Energy Lett. 2025 Jun 28;10(7):3533-3543. doi: 10.1021/acsenergylett.5c00989. eCollection 2025 Jul 11.

Abstract

To commercialize lead halide perovskites as light-emitting diodes (LEDs), the operational device lifetime needs to be drastically improved. For this to be achieved, an understanding of degradation behavior under bias is crucial. Herein, we perform operando measurements of the structural, chemical, and electronic changes using synchrotron-based grazing-incidence wide-angle X-ray scattering and hard X-ray photoelectron spectroscopy on full-stack deep blue mixed bromide/chloride lead halide perovskite LEDs. While a clear drop in optoelectronic performance is recorded under electrical bias, the accompanying X-ray scattering data reveals only minor changes in structural properties. However, photoelectron spectroscopy reveals substantial chemical changes at the electron-injecting interface after bias is applied, including the formation of unwanted metallic lead and a new chlorine species that is not in the perovskite structure. These operando approaches give important structural and interfacial perspectives to reveal the degradation mechanisms in these LEDs and highlight the need to address the top electron-injecting interface to realize step-changes in operational stability.

摘要

为了将卤化铅钙钛矿商业化用于发光二极管(LED),需要大幅提高其器件的工作寿命。要实现这一点,了解偏压下的降解行为至关重要。在此,我们使用基于同步加速器的掠入射广角X射线散射和硬X射线光电子能谱对全栈深蓝色混合溴化物/氯化物卤化铅钙钛矿LED进行结构、化学和电子变化的原位测量。虽然在电偏压下记录到光电性能明显下降,但伴随的X射线散射数据仅显示结构性质有微小变化。然而,光电子能谱显示在施加偏压后,电子注入界面发生了显著的化学变化,包括形成了不需要的金属铅和一种不在钙钛矿结构中的新氯物种。这些原位方法为揭示这些LED的降解机制提供了重要的结构和界面视角,并突出了需要解决顶部电子注入界面以实现工作稳定性的阶跃变化。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3585/12261314/49c01e01b5e2/nz5c00989_0001.jpg

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